| Generating test programs to cover pipeline interactions |
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Annual ACM IEEE Design Automation Conference
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Proceedings of the 46th Annual Design Automation Conference
table of contents
San Francisco, California
SESSION: Profiling, test and debug of embedded systems
table of contents
Pages 142-147
Year of Publication: 2009
ISBN:978-1-60558-497-3
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Downloads (6 Weeks): 14, Downloads (12 Months): 14, Citation Count: 0
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ABSTRACT
Functional validation of a processor design through execution of a suite of test programs is common industrial practice. In this paper, we develop a high-level architectural specification driven methodology for systematic test-suite generation. Our primary contribution is an automated test-suite generation methodology that covers all possible processor pipeline interactions. To accomplish this automation, we (1) develop a fully formal processor model based on communicating extended finite state machines, and (2) traverse the processor model for on-the-fly generation of short test programs covering all reachable states and transitions. Our test generation method achieves several orders of magnitude reduction in test-suite size compared to the previously proposed formal approaches for test generation, leading to drastic reduction in validation effort.
REFERENCES
Note: OCR errors may be found in this Reference List extracted from the full text article. ACM has opted to expose the complete List rather than only correct and linked references.
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