ACM Home Page
Please provide us with feedback. Feedback
Generating test programs to cover pipeline interactions
Full text PdfPdf (327 KB)
Source Annual ACM IEEE Design Automation Conference archive
Proceedings of the 46th Annual Design Automation Conference table of contents
San Francisco, California
SESSION: Profiling, test and debug of embedded systems table of contents
Pages 142-147  
Year of Publication: 2009
ISBN:978-1-60558-497-3
Authors
Thanh Nga Dang  National University of Singapore
Abhik Roychoudhury  National University of Singapore
Tulika Mitra  National University of Singapore
Prabhat Mishra  Univ. of Florida, Gainesville
Sponsors
EDAC : Electronic Design Automation Consortium
SIGDA: ACM Special Interest Group on Design Automation
IEEE-CAS : Circuits & Systems
Publisher
ACM  New York, NY, USA
Bibliometrics
Downloads (6 Weeks): 14,   Downloads (12 Months): 14,   Citation Count: 0
Additional Information:

abstract   references   index terms  

Tools and Actions: Request Permissions Request Permissions    Review this Article  
DOI Bookmark: Use this link to bookmark this Article: http://doi.acm.org/10.1145/1629911.1629953
What is a DOI?

ABSTRACT

Functional validation of a processor design through execution of a suite of test programs is common industrial practice. In this paper, we develop a high-level architectural specification driven methodology for systematic test-suite generation. Our primary contribution is an automated test-suite generation methodology that covers all possible processor pipeline interactions. To accomplish this automation, we (1) develop a fully formal processor model based on communicating extended finite state machines, and (2) traverse the processor model for on-the-fly generation of short test programs covering all reachable states and transitions. Our test generation method achieves several orders of magnitude reduction in test-suite size compared to the previously proposed formal approaches for test generation, leading to drastic reduction in validation effort.


REFERENCES

Note: OCR errors may be found in this Reference List extracted from the full text article. ACM has opted to expose the complete List rather than only correct and linked references.

 
1
A. Aharon et al. Test program generation for functional verification of PowerPC processors in IBM. In DAC, 1995.
 
2
T. Austin, E. Larson, and D. Ernst. Simplescalar: An infrastructure for computer system modeling. IEEE Computer, 35(2), 2002.
 
3
K. T. Cheng and A. S. Krishnakumar. Automatic functional test generation using the extended finite state machine model. In DAC, 1993.
 
4
T. A. Diep and J. P. Shen. Systematic validation of pipeline interlock for superscalar microarchitectures. In FTCS, 1995.
 
5
D. Geist, M. Farkas, A. Landver, Y. Lichtenstein, S. Ur, and Y. Wolfsthal. Coverage-directed test generation using symbolic techniques. In FMCAD, 1996.
 
6
H-M. Koo and P. Mishra. Functional test generation using design and property decomposition techniques. ACM TECS, 8(4), 2009.
 
7
P. Mishra and N. Dutt. Specification-driven directed test generation for validation of pipelined processors. ACM TODAES, 13(2), 2008.
 
8
W. Qin and S. Malik. Flexible and formal modeling of microprocessors with application to retargetable simulation. In DATE, 2003.
 
9
W. Qin, S. Rajagopalan, and S. Malik. A formal concurrency model based architecture description language for synthesis of software development tools. In LCTES, 2004.
 
10
S. Ur and Y. Yadin. Micro-arachitecture coverage directed generation of test programs. In DAC, 1999.
 
11
Q. Zhu, A. Shrivastava, and N. Dutt. Functional and timing validation of partially bypassed processor pipelines. In DATE, 2007.