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Decoding nanowire arrays fabricated with the multi-spacer patterning technique
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Source Annual ACM IEEE Design Automation Conference archive
Proceedings of the 46th Annual Design Automation Conference table of contents
San Francisco, California
SESSION: Design and optimization of nanocircuits table of contents
Pages 77-82  
Year of Publication: 2009
ISBN:978-1-60558-497-3
Authors
M. Haykel Ben Jamaa  Swiss Federal Institute of Technology (EPFL), Lausanne, Switzerland
Yusuf Leblebici  Swiss Federal Institute of Technology (EPFL), Lausanne, Switzerland
Giovanni De Micheli  Swiss Federal Institute of Technology (EPFL), Lausanne, Switzerland
Sponsors
EDAC : Electronic Design Automation Consortium
SIGDA: ACM Special Interest Group on Design Automation
IEEE-CAS : Circuits & Systems
Publisher
ACM  New York, NY, USA
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ABSTRACT

Silicon nanowires are a promising solution to address the increasing challenges of fabrication and design at the future nodes of the Complementary Metal-Oxide-Semiconductor (CMOS) Technology roadmap. Despite the attractive opportunity that offers their organization onto regular crossbars, the problem of designing the nano-wire decoder is still challenging and highly dependent on the nanowire fabrication technology. In this paper, we introduce a novel design style and encoding scheme for decoding nanowires fabricated with the Multi-Spacer-Patterning Technique (MSPT); and we present a method based on Gray codes that reduces the fabrication cost and improves the decoder reliability. We show that by arranging the code in a Gray code fashion, we decrease the fabrication complexity by 17% and the variability by 18% on average. By optimizing the decoder parameters, the simulations showed an improvement of the crossbar yield by 40% and a reduction of the effective bit area by 51% to 169 nm2.


REFERENCES

Note: OCR errors may be found in this Reference List extracted from the full text article. ACM has opted to expose the complete List rather than only correct and linked references.

 
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