| A fault tolerant cache architecture for sub 500mV operation: resizable data composer cache (RDC-cache) |
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International Conference on Compilers, Architecture and Synthesis for Embedded Systems
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Proceedings of the 2009 international conference on Compilers, architecture, and synthesis for embedded systems
table of contents
Grenoble, France
SESSION: Reliability and reconfigurability
table of contents
Pages 251-260
Year of Publication: 2009
ISBN:978-1-60558-626-7
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Downloads (6 Weeks): 14, Downloads (12 Months): 14, Citation Count: 0
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ABSTRACT
In this paper we introduce Resizable Data Composer-Cache (RDC-Cache). This novel cache architecture operates correctly at sub 500 mV in 65 nm technology tolerating large number of Manufacturing Process Variation induced defects. Based on a smart relocation methodology, RDC-Cache decomposes the data that is targeted for a defective cache way and relocates one or few word to a new location avoiding a write to defective bits. Upon a read request, the requested data is recomposed through an inverse operation. For the purpose of fault tolerance at low voltages the cache size is reduced, however, in this architecture the final cache size is considerably higher compared to previously suggested resizable cache organizations [2][3]. The following three features a) compaction of relocated words, b)ability to use defective words for fault tolerance and c) "linking" (relocating the defective word to any row in the next bank), allows this architecture to achieve far larger fault tolerance in comparison to [2][3]. In high voltage mode, the fault tolerant mechanism of RDC-Cache is turned-off with minimal (0.91%) latency overhead compared to a traditional cache.
REFERENCES
Note: OCR errors may be found in this Reference List extracted from the full text article. ACM has opted to expose the complete List rather than only correct and linked references.
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INDEX TERMS
Primary Classification:
B.
Hardware
B.3
MEMORY STRUCTURES
B.3.1
Semiconductor Memories
Subjects:
Static memory (SRAM)
Additional Classification:
B.
Hardware
B.1
CONTROL STRUCTURES AND MICROPROGRAMMING
B.1.3
Control Structure Reliability, Testing, and Fault-Tolerance**
B.3
MEMORY STRUCTURES
B.3.2
Design Styles
Subjects:
Shared memory;
Cache memories
General Terms:
Algorithms,
Design,
Reliability,
Theory
Keywords:
fault tolerance,
low power cache,
low power design,
low power memory organization,
memory organization.,
remapping cache,
variation aware cache,
vfs
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