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Javalanche: efficient mutation testing for Java
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Foundations of Software Engineering archive
Proceedings of the 7th joint meeting of the European software engineering conference and the ACM SIGSOFT symposium on The foundations of software engineering on European software engineering conference and foundations of software engineering symposium table of contents
Amsterdam, The Netherlands
DEMONSTRATION SESSION: Tool demonstrations table of contents
Pages 297-298  
Year of Publication: 2009
ISBN:978-1-60558-001-2
Authors
David Schuler  Saarland University, Saarbrücken, Germany
Andreas Zeller  Saarland University, Saarbrücken, Germany
Sponsors
ACM: Association for Computing Machinery
SIGSOFT: ACM Special Interest Group on Software Engineering
Publisher
ACM  New York, NY, USA
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ABSTRACT

To assess the quality of a test suite, one can use mutation testing - seeding artificial defects (mutations) into the program and checking whether the test suite finds them. Javalanche is an open source framework for mutation testing Java programs with a special focus on automation, efficiency, and effectiveness. In particular, Javalanche assesses the impact of individual mutations to effectively weed out equivalent mutants; it has been demonstrated to work on programs with up to 100,000 lines of code.


REFERENCES

Note: OCR errors may be found in this Reference List extracted from the full text article. ACM has opted to expose the complete List rather than only correct and linked references.

 
1
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2
B. J. M. Grün, D. Schuler, and A. Zeller. The impact of equivalent mutants. In Mutation 2009: International Workshop on Mutation Analysis, Apr. 2009.
 
3
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A. J. Offutt and R. H. Untch. Mutation 2000: Uniting the orthogonal, pages 34--44. Kluwer Academic Publishers, Norwell, MA, USA, 2001.
 
5
D. Schuler, V. Dallmeier, and A. Zeller. Efficient mutation testing by checking invariant violations. In ISSTA '09: Proceedings of the 2009 International Symposium on Software Testing and Analysis, July 2009. To appear.
 
6
R. H. Untch, A. J. Offutt, and M. J. Harrold. Mutation analysis using mutant schemata. In ISSTA '93: Proceedings of the 1993 International Symposium on Software Testing and Analysis, pages 139--148, New York, NY, USA, 1993. ACM.