ACM Home Page
Please provide us with feedback. Feedback
A compaction method for full chip VLSI layouts
Full text PdfPdf (612 KB)
Source Annual ACM IEEE Design Automation Conference archive
Proceedings of the 30th international Design Automation Conference table of contents
Dallas, Texas, United States
Pages: 407 - 412  
Year of Publication: 1993
ISBN:0-89791-577-1
Authors
Sponsors
EDAC : Electronic Design Automation Consortium
IEEE-CAS : Circuits & Systems
SIGDA: ACM Special Interest Group on Design Automation
Publisher
ACM  New York, NY, USA
Bibliometrics
Downloads (6 Weeks): 8,   Downloads (12 Months): 11,   Citation Count: 1
Additional Information:

references   cited by   index terms   collaborative colleagues  

Tools and Actions: Request Permissions Request Permissions    Review this Article  
DOI Bookmark: Use this link to bookmark this Article: http://doi.acm.org/10.1145/157485.164953
What is a DOI?

REFERENCES

Note: OCR errors may be found in this Reference List extracted from the full text article. ACM has opted to expose the complete List rather than only correct and linked references.

1
 
2
 
3
4
 
5
6
 
7
8
 
9
H. Kitazawa and K. Ueda. "A look-ahead line search algorithm with high wireability for custom VLSI design". Proc. 1SCAS 1985, 1035-1038, 1985.
 
10
Cadence Design Systems, Inc. "Opus IC Design System Reference Manual". 1991.


Collaborative Colleagues:
Joseph Dao: colleagues
Nobu Matsumoto: colleagues
Tsuneo Hamai: colleagues
Chusei Ogawa: colleagues
Shojiro Mori: colleagues