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Improved techniques for probabilistic simulation including signal correlation effects
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Source Annual ACM IEEE Design Automation Conference archive
Proceedings of the 30th international Design Automation Conference table of contents
Dallas, Texas, United States
Pages: 379 - 383  
Year of Publication: 1993
ISBN:0-89791-577-1
Authors
Sponsors
EDAC : Electronic Design Automation Consortium
IEEE-CAS : Circuits & Systems
SIGDA: ACM Special Interest Group on Design Automation
Publisher
ACM  New York, NY, USA
Bibliometrics
Downloads (6 Weeks): 7,   Downloads (12 Months): 8,   Citation Count: 4
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REFERENCES

Note: OCR errors may be found in this Reference List extracted from the full text article. ACM has opted to expose the complete List rather than only correct and linked references.

 
1
F. Najm, R. Burch, P. Yang, and I. Hajj. Probabilistic Simulation for Reliability Analysis of CMOS VLSI Circuits. IEEE Transactions on Computer Aided Design, 9(4):439-450, 1990.
 
2
Georgios I. Stamoulis. New Techniques for Probabilistic Simulation of VLSI CMOS Circuits. Master's thesis, University of Illinois at Urbana-Champaign, 1991. UILU-ENG-91-2246 DAC-30.
 
3
S.C. Seth, L. Pan, and V.D. Aggrawal. PREDICT - probabilistic estimation of digital circuit testability. IEEE 15th Annual International Symposium on Faull- Tolerant Computing, pages 220-225, 1985.
 
4
S. Ercolani, M. Favalli, M. Damiani, P. Olivo, and P. Ricco. Estimate of signal probabilities in combinational logic networks. IEEE European Test Conference, pages 132-138, 1989.
 
5
Athanasios Papoulis. Probability, Random Variables and Stochastic Processes. Mc Graw-Hill Book Co., 2 edition, 1984.


Collaborative Colleagues:
Georgios I. Stamoulis: colleagues
Ibrahim N. Hajj: colleagues