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On routability prediction for field-programmable gate arrays
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Source Annual ACM IEEE Design Automation Conference archive
Proceedings of the 30th international Design Automation Conference table of contents
Dallas, Texas, United States
Pages: 326 - 330  
Year of Publication: 1993
ISBN:0-89791-577-1
Authors
Sponsors
EDAC : Electronic Design Automation Consortium
IEEE-CAS : Circuits & Systems
SIGDA: ACM Special Interest Group on Design Automation
Publisher
ACM  New York, NY, USA
Bibliometrics
Downloads (6 Weeks): 11,   Downloads (12 Months): 25,   Citation Count: 22
Additional Information:

references   cited by   index terms   collaborative colleagues  

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REFERENCES

Note: OCR errors may be found in this Reference List extracted from the full text article. ACM has opted to expose the complete List rather than only correct and linked references.

 
1
XILINX:The Programmable Gate Array Data Book. 2100 Logic Drive, San Jose, CA 95124, 1992.
 
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K. A. E1-Ayat, A. E1 Gamal, R. Guo, J. Chang, R. K. Mak, F. Chiu, E. Z. Hamdy, J. McCollum, and A. Mohsen. A CMOS electrically configurable gate array. IEEE JSSC, 24(3):752-762, June 1989.
 
4
A. El Gamal. Two-Dimensional Stochastic Model for Interconnections in Master Slice Integrated Circuits. IEEE Trans CAS, 28(2):127-138, Feb. 1981.
 
5
M. Feuer. Connectivity of Random Logic. IEEE TC, C-31(1):29-33, Jan. 1982.
 
6
 
7
D. Hill and N.-S. Woo. The benefits of flexibility in look-up table FPGAs. In Proc. of Intl. Workshop on Field Programmable Logic and Applications, Oxford, England, Sept. 1991.
 
8
F. Kurdahi and A. C. Parker. Rent's rule and average wire length in standard cell layouts. Unpublished manuscript, Dec. 1989.
 
9
B. Osann and A. El Gamal. Compare ASIC capacities with gate array benchmarks. Electronic Design, Oct. 1988.
 
10
M. Pedram and B. Preas. Interconnection length estimation for optimized standard cell layouts. IEEE ICCAD 89, pg.390-393, Nov. 1989.
 
11
Quickturn Systems Inc. 325 East Middlefield Road, Mountain View, CA 94043, 1991.
 
12
S. Sa~try and A. C. Parker. Stochastic Models for Wireability Analysis of Gate Arrays. IEEE Trans. on CAD, CAD-5(1):52-65, Jan. 1986.
 
13

CITED BY  22

Collaborative Colleagues:
Pak K. Chan: colleagues
Martine D. F. Schlag: colleagues
Jason Y. Zien: colleagues