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Sequential circuit test generation on a distributed system
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Source Annual ACM IEEE Design Automation Conference archive
Proceedings of the 30th international Design Automation Conference table of contents
Dallas, Texas, United States
Pages: 107 - 111  
Year of Publication: 1993
ISBN:0-89791-577-1
Authors
P. Agrawal
V. D. Agrawal
J. Villoldo
Sponsors
EDAC : Electronic Design Automation Consortium
IEEE-CAS : Circuits & Systems
SIGDA: ACM Special Interest Group on Design Automation
Publisher
ACM  New York, NY, USA
Bibliometrics
Downloads (6 Weeks): 5,   Downloads (12 Months): 8,   Citation Count: 5
Additional Information:

references   cited by   index terms   collaborative colleagues  

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REFERENCES

Note: OCR errors may be found in this Reference List extracted from the full text article. ACM has opted to expose the complete List rather than only correct and linked references.

1
Srinivas Patil , Prithviraj Banerjee , Janak H. Patel, Parallel test generation for sequential circuits on general-purpose multiprocessors, Proceedings of the 28th conference on ACM/IEEE design automation, p.155-159, June 17-22, 1991, San Francisco, California, United States  [doi>10.1145/127601.127651]
 
2
Balkrishna Ramkumar , Prithviraj Banerjee, Portable parallel test generation for sequential circuits, Proceedings of the 1992 IEEE/ACM international conference on Computer-aided design, p.220-223, November 1992, Santa Clara, California, United States
 
3
Wu-Tung Cheng , Tapan J. Chakraborty, Gentest: An Automatic Test-Generation System for Sequential Circuits, Computer, v.22 n.4, p.43-49, April 1989  [doi>10.1109/2.25381]
 
4
T.M. Niermann, W.-T. Cheng, and J.H. Patel, "PROOFS: A Fast, Memory-Efficient Sequential Circuit Fault Simulator," IEEE Trans. CAD, Vol. 11, pp. 198-207, February 1992.
 
5
B. Bencivenga, T.J. Chakraborty, and S. Davidson, "The Architecture of the GenTest Sequential Circuit Test Generator," Proc. Custom Integrated Circuits Conference, pp. 17.1.1-17.1.4, May 1991.
 
6
Alfred V. Aho , Brian W. Kernighan , Peter J. Weinberger, The AWK programming language, Addison-Wesley Longman Publishing Co., Inc., Boston, MA, 1987
 
7
V. D. Agrawal , S. T. Chakradhar, Performance Analysis of Synchronized Iterative Algorithms on Multiprocessor Systems, IEEE Transactions on Parallel and Distributed Systems, v.3 n.6, p.739-746, November 1992  [doi>10.1109/71.180628]

CITED BY  5
Steven Parkes , Prithviraj Banerjee , Janak Patel, ProperHITEC: a portable, parallel, object-oriented approach to sequential test generation, Proceedings of the 31st annual conference on Design automation, p.717-721, June 06-10, 1994, San Diego, California, United States
Debashis Bhattacharya , Prathima Agrawal, Boolean algebraic test generation using a distributed system, Proceedings of the 1993 IEEE/ACM international conference on Computer-aided design, p.440-443, November 07-11, 1993, Santa Clara, California, United States
James Sienicki , Michael Bushnell , Prathima Agrawal , Vishwani Agrawal, An adaptive distributed algorithm for sequential circuit test generation, Proceedings of the conference on European design automation, p.236-241, September 18-22, 1995, Brighton, England
Pradeep Prabhakaran , Prithviraj Banerjee, Parallel Algorithms for Force Directed Scheduling of Flattened and Hierarchical Signal Flow Graphs, IEEE Transactions on Computers, v.48 n.7, p.762-768, July 1999
Peter A. Krauss , Andreas Ganz , Kurt J. Antreich, Distributed Test Pattern Generation for Stuck-At Faults in Sequential Circuits, Journal of Electronic Testing: Theory and Applications, v.11 n.3, p.227-245, Dec. 1997

INDEX TERMS

Primary Classification:
  B. Hardware
  B.6 LOGIC DESIGN
      B.6.1 Design Styles
          Subjects: Sequential circuits

Additional Classification:
  B. Hardware
  B.6 LOGIC DESIGN
      B.6.2 Reliability and Testing**
          Subjects: Test generation**

  C. Computer Systems Organization
  C.2 COMPUTER-COMMUNICATION NETWORKS

  F. Theory of Computation
  F.1 COMPUTATION BY ABSTRACT DEVICES
      F.1.2 Modes of Computation
          Subjects: Parallelism and concurrency
  F.2 ANALYSIS OF ALGORITHMS AND PROBLEM COMPLEXITY


General Terms:
Algorithms, Design, Measurement, Performance

Collaborative Colleagues:
P. Agrawal: colleagues
V. D. Agrawal: colleagues
J. Villoldo: colleagues

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