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Evaluating effects of machine translation accuracy on cross-lingual patent retrieval
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Annual ACM Conference on Research and Development in Information Retrieval archive
Proceedings of the 32nd international ACM SIGIR conference on Research and development in information retrieval table of contents
Boston, MA, USA
POSTER SESSION: Posters table of contents
Pages 674-675  
Year of Publication: 2009
ISBN:978-1-60558-483-6
Authors
Atsushi Fujii  University of Tsukuba, Tsukuba, Japan
Masao Utiyama  NICT, Hikaridai, Japan
Mikio Yamamoto  University of Tsukuba, Tsukuba, Japan
Takehito Utsuro  University of Tsukuba, Tsukuba, Japan
Sponsors
SIGIR: ACM Special Interest Group on Information Retrieval
ACM: Association for Computing Machinery
Publisher
ACM  New York, NY, USA
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ABSTRACT

We organized a machine translation (MT) task at the Seventh NTCIR Workshop. Participating groups were requested to machine translate sentences in patent documents and also search topics for retrieving patent documents across languages. We analyzed the relationship between the accuracy of MT and its effects on the retrieval accuracy.


REFERENCES

Note: OCR errors may be found in this Reference List extracted from the full text article. ACM has opted to expose the complete List rather than only correct and linked references.

 
1
A. Fujii, M. Iwayama, and N. Kando. Test collections for patent retrieval and patent classification in the fifth NTCIR workshop. In Proceedings of the 5th International Conference on Language Resources and Evaluation, pages 671--674, 2006.
 
2

Collaborative Colleagues:
Atsushi Fujii: colleagues
Masao Utiyama: colleagues
Mikio Yamamoto: colleagues
Takehito Utsuro: colleagues