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Classification of software behaviors for failure detection: a discriminative pattern mining approach
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International Conference on Knowledge Discovery and Data Mining archive
Proceedings of the 15th ACM SIGKDD international conference on Knowledge discovery and data mining table of contents
Paris, France
SESSION: Research track papers table of contents
Pages 557-566  
Year of Publication: 2009
ISBN:978-1-60558-495-9
Authors
David Lo  Singapore Management University, Singapore, Singapore
Hong Cheng  Chinese University of Hong Kong, Hong Kong, China
Jiawei Han  University of Illinois at Urbana-Champaign, Urbana-Champaign, USA
Siau-Cheng Khoo  National University of Singapore, Singapore, Singapore
Chengnian Sun  National University of Singapore, Singapore, Singapore
Sponsors
ACM: Association for Computing Machinery
SIGKDD: ACM Special Interest Group on Knowledge Discovery in Data
SIGMOD: ACM Special Interest Group on Management of Data
Publisher
ACM  New York, NY, USA
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ABSTRACT

Software is a ubiquitous component of our daily life. We often depend on the correct working of software systems. Due to the difficulty and complexity of software systems, bugs and anomalies are prevalent. Bugs have caused billions of dollars loss, in addition to privacy and security threats. In this work, we address software reliability issues by proposing a novel method to classify software behaviors based on past history or runs. With the technique, it is possible to generalize past known errors and mistakes to capture failures and anomalies. Our technique first mines a set of discriminative features capturing repetitive series of events from program execution traces. It then performs feature selection to select the best features for classification. These features are then used to train a classifier to detect failures. Experiments and case studies on traces of several benchmark software systems and a real-life concurrency bug from MySQL server show the utility of the technique in capturing failures and anomalies. On average, our pattern-based classification technique outperforms the baseline approach by 24.68% in accuracy.


REFERENCES

Note: OCR errors may be found in this Reference List extracted from the full text article. ACM has opted to expose the complete List rather than only correct and linked references.

 
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Collaborative Colleagues:
David Lo: colleagues
Hong Cheng: colleagues
Jiawei Han: colleagues
Siau-Cheng Khoo: colleagues
Chengnian Sun: colleagues