Partitioned n-detection test generation

ABSTRACT

We describe a method for improving the quality of <i>n</i>-detection test sets. Unlike earlier methods for achieving the same goal, the proposed method is based on the conventional definition of the number of detections and uses a conventional <i>n</i>-detection test generation process. Under the proposed method, the set of target faults is partitioned into two or more subsets. <i>n</i>-detection test generation is carried out for each subset separately. The resulting test sets are combined into a single test set. Partitioning causes more faults to be targeted directly, and fewer faults to be dropped due to accidental detection. The fault subsets can be selected based on detection conditions of common defects. In this work we partition the set of faults into a subset that consists of all the stuck-at 0 faults, and a subset that consists of all the stuck-at 1 faults. We demonstrate through experimental results that for the same test set size, partitioning the set of faults improves the coverage of untargeted faults (non-feedback four-way bridging faults) compared to <i>n</i>-detection test generation for the unpartitioned set of faults.

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INDEX TERMS

Primary Classification:
  B. Hardware
  B.8 Performance and Reliability
      B.8.1 Reliability, Testing, and Fault-Tolerance

General Terms:
Reliability

Keywords:
bridging faults, fault partitioning, n-detection test sets, stuck-at faults, test generation