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Multi-level fault modeling for transaction-level specifications
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Great Lakes Symposium on VLSI archive
Proceedings of the 19th ACM Great Lakes symposium on VLSI table of contents
Boston Area, MA, USA
SESSION: Testing table of contents
Pages 87-92  
Year of Publication: 2009
ISBN:978-1-60558-522-2
Authors
Giovanni Beltrame  European Space Agency, Noordwijk, Netherlands
Cristiana Bolchini  Politecnico di Milano, Milano, Italy
Antonio Miele  Politecnico di Milano, Milano, Italy
Sponsors
ACM: Association for Computing Machinery
SIGDA: ACM Special Interest Group on Design Automation
Publisher
ACM  New York, NY, USA
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ABSTRACT

Fault modeling is a fundamental element for several activities, ranging from off- and on-line testing, to fault tolerance and dependability-aware design. These activities are carried out during various design phases, dealing with specifications at different abstraction levels. Therefore, modeling faults across abstraction levels is of paramount importance to introduce dependability-related issues from the early phases of design. This paper analyzes how faults can be modeled at the different levels of abstraction with respect to Transaction Level Models, and how these models are related across levels. The work focuses on soft errors and aims at providing support to dependability analysis. A case study of a Transaction Level specification of a Network-on-Chip switch is used to evaluate the methodology and its applicability.


REFERENCES

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Collaborative Colleagues:
Giovanni Beltrame: colleagues
Cristiana Bolchini: colleagues
Antonio Miele: colleagues