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A systematic method for generating quality requirements spectrum
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Symposium on Applied Computing archive
Proceedings of the 2009 ACM symposium on Applied Computing table of contents
Honolulu, Hawaii
POSTER SESSION: Poster papers table of contents
Pages 399-400  
Year of Publication: 2009
ISBN:978-1-60558-166-8
Authors
Shunichi Suzuki  Shinshu University, Japan
Akira Osada  Shinshu University, Japan
Tomonori Sato  Shinshu University, Japan
Haruhiko Kaiya  Shinshu University and GRACE Center NII, Japan
Masaaki Tanigawa  Shinshu University, Japan
Kenji Kaijiri  Shinshu University, Japan
Sponsor
SIGAPP: ACM Special Interest Group on Applied Computing
Publisher
ACM  New York, NY, USA
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ABSTRACT

Spectrum analysis for quality requirements is useful for measuring and tracking them, but current spectrum analysis largely depends on expertise of each analyst. Therefore, it takes a lot of efforts to perform the analysis and is hard to reuse experiences for such analysis. We introduce domain knowledge called term-characteristic map to improve current spectrum analysis for quality requirements. Through several experiments, we evaluated the improved method for spectrum analysis.



Collaborative Colleagues:
Shunichi Suzuki: colleagues
Akira Osada: colleagues
Tomonori Sato: colleagues
Haruhiko Kaiya: colleagues
Masaaki Tanigawa: colleagues
Kenji Kaijiri: colleagues