| Systematic architecture exploration based on optimistic cycle estimation for low energy embedded processors |
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Asia and South Pacific Design Automation Conference
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Proceedings of the 2009 Asia and South Pacific Design Automation Conference
table of contents
Yokohama, Japan
SESSION: Energy-aware system level design methodology
table of contents
Pages 449-454
Year of Publication: 2009
ISBN:978-1-4244-2748-2
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Authors
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Ittetsu Taniguchi
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Osaka University, Japan
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Murali Jayapala
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Nomadic Embedded Systems, IMEC vzw., Belgium
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Praveen Raghavan
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Nomadic Embedded Systems, IMEC vzw., Belgium and Katholieke Universiteit Leuven, Belgium
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Francky Catthoor
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Nomadic Embedded Systems, IMEC vzw., Belgium and Katholieke Universiteit Leuven, Belgium
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Keishi Sakanushi
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Osaka University, Japan
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Yoshinori Takeuchi
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Osaka University, Japan
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Masaharu Imai
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Osaka University, Japan
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IEEE Press
Piscataway, NJ, USA
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| Bibliometrics |
Downloads (6 Weeks): 11, Downloads (12 Months): 37, Citation Count: 0
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ABSTRACT
Systematic architecture exploration from vast solution space is a complex problem in embedded system design. It is very difficult to explore a best architecture fast and accurately because accurate evaluation usually consumes significant amount of time for point in the solution space. In this paper, we propose fast and systematic architecture exploration method for address generation unit (AGU) based on a coarse grained reconfigurable architecture model. First we prove that a set of Pareto solutions of cycle vs energy becomes a subset of Pareto solutions of cycle vs area under some practical assumptions. In addition we propose "Optimistic cycle (OC)" metric to find out promising solutions from vast solution space. Based on this metric we also propose a fast architecture exploration algorithm which only applies mapping to promising architectures. Using the proposed systematic architecture exploration method, we show that we can obtain almost the same trade-off points as the exhaustive search method and also that our method is about 164 times faster than exhaustive search.
REFERENCES
Note: OCR errors may be found in this Reference List extracted from the full text article. ACM has opted to expose the complete List rather than only correct and linked references.
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