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The road to 3D EDA tool readiness
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Asia and South Pacific Design Automation Conference archive
Proceedings of the 2009 Asia and South Pacific Design Automation Conference table of contents
Yokohama, Japan
SESSION: Challenges in 3D integrated circuit design table of contents
Pages 429-436  
Year of Publication: 2009
ISBN:978-1-4244-2748-2
Authors
Charles Chiang  Synopsys, Inc.
Subarna Sinha  Synopsys, Inc.
Sponsors
: IEEE Circuits and Systems Society
SIGDA: ACM Special Interest Group on Design Automation
IEICE ESS : Institute of Electronics, Information and Communication Engineers - Engineering Sciences Society
IPSJ SIGSLDM : Information Processing Society of Japan - SIG System LSI Design Methodology
Publisher
IEEE Press  Piscataway, NJ, USA
Bibliometrics
Downloads (6 Weeks): 33,   Downloads (12 Months): 143,   Citation Count: 0
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ABSTRACT

Today's SoCs/SIPs face numerous design challenges as increased integration of system components on a single die stretches the limits of technology and design capacity. 3D integration, where multiple dies are stacked and interconnected in the vertical dimension using through-silicon vias (TSVs), is probably the best hope for carrying ICs along (and even beyond) the path of Moore's law in the 21st century. However successful adoption of 3D ICs will require among other things modifications to EDA tools to enable 3D IC design. In this paper, we identify key stages in EDA that need modification to handle 3D ICs, highlight the challenges and review existing solutions, if they exist. Whenever appropriate, at a particular stage, we also provide preferred features of the solutions necessary to enable 3D IC design with the least amount of disruption.


REFERENCES

Note: OCR errors may be found in this Reference List extracted from the full text article. ACM has opted to expose the complete List rather than only correct and linked references.

 
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Collaborative Colleagues:
Charles Chiang: colleagues
Subarna Sinha: colleagues