| A novel thermal optimization flow using incremental floorplanning for 3D ICs |
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Asia and South Pacific Design Automation Conference
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Proceedings of the 2009 Asia and South Pacific Design Automation Conference
table of contents
Yokohama, Japan
SESSION: Beyond traditional floorplanning and placement
table of contents
Pages 347-352
Year of Publication: 2009
ISBN:978-1-4244-2748-2
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Authors
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Xin Li
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Tsinghua University, Beijing, P.R.China
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Yuchun Ma
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Tsinghua University, Beijing, P.R.China
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Xianlong Hong
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Tsinghua University, Beijing, P.R.China
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IEEE Press
Piscataway, NJ, USA
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Downloads (6 Weeks): 23, Downloads (12 Months): 77, Citation Count: 0
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ABSTRACT
Thermal issue is a critical challenge in 3D IC design. To eliminate hotspots, physical layouts are always adjusted by shifting or duplicating hot blocks. However, these modifications may degrade the packing area as well as interconnect distribution greatly. In this paper, we propose some novel thermal-aware incremental changes to optimize these multiple objectives including thermal issue in 3D ICs. Furthermore, to avoid random incremental modification, which may be inefficient and need long runtime to converge, here potential gain is modeled for each candidate incremental change. Based on the potential gain, a novel thermal optimization flow to intelligently choose the best incremental operation is presented. We distinguish the thermal-aware incremental changes in three different categories: migrating computation, growing unit and moving hotspot. Mixed integer linear programming (MILP) models are devised according to these different incremental changes. Experimental results show that migrating computation, growing unit and moving hotspot can reduce max on-chip temperature by 7%, 13% and 15% respectively on MCNC/GSRC benchmarks. Still, experimental results also show that the thermal optimization flow can reduce max on-chip temperature by 14% compared to an existing 3D floorplan tool CBA, and achieve better area and total wirelength improvement than individual operations do.
REFERENCES
Note: OCR errors may be found in this Reference List extracted from the full text article. ACM has opted to expose the complete List rather than only correct and linked references.
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