| Incremental and on-demand random walk for iterative power distribution network analysis |
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Asia and South Pacific Design Automation Conference
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Proceedings of the 2009 Asia and South Pacific Design Automation Conference
table of contents
Yokohama, Japan
SESSION: Power analysis and optimization
table of contents
Pages 185-190
Year of Publication: 2009
ISBN:978-1-4244-2748-2
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Authors
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Yiyu Shi
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UCLA, Los Angeles, California
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Wei Yao
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UCLA, Los Angeles, California
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Jinjun Xiong
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IBM Thomas J. Watson Research Center, Yorktown Heights, New York
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Lei He
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UCLA, Los Angeles, California
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IEEE Press
Piscataway, NJ, USA
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Downloads (6 Weeks): 14, Downloads (12 Months): 42, Citation Count: 0
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ABSTRACT
Power distribution networks (PDNs) are designed and analyzed iteratively. Random walk is among the most efficient methods for PDN analysis. We develop in this paper an incremental and on-demand random walk to reduce iterative analysis time. During each iteration, we map the design changes as positive or negative random walks for observed nodes. To update PDN analysis result, we only need to apply these extra positive or negative walks, instead of doing all walks from scratch. We show that different execution orders for these walks do not affect accuracy but do affect the runtime because of the cancellation between positive and negative walks. Considering this cancellation effect, we optimize the walk order by solving a min-energy electromagnetic particles placement problem and, as a result, further reduce the runtime to about 8x compared to the worst order. Experiments show that, compared to random walk from scratch, our algorithm has similar accuracy but reduces the iterative analysis time by up to 18x for on-chip PDN sizing, and by up to 13x for package ball assignment with substrate routing. In addition, our incremental random walk has a linear time complexity with respect to the number of observed nodes and is more suitable for on-demand analysis, compared to random walk from scratch and its big warm-up cost.
REFERENCES
Note: OCR errors may be found in this Reference List extracted from the full text article. ACM has opted to expose the complete List rather than only correct and linked references.
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