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Robust FPGA resynthesis based on fault-tolerant Boolean matching
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International Conference on Computer Aided Design archive
Proceedings of the 2008 IEEE/ACM International Conference on Computer-Aided Design table of contents
San Jose, California
SESSION: Improving FPGA reliability table of contents
Pages 706-713  
Year of Publication: 2008
ISBN ~ ISSN:1092-3152 , 978-1-4244-2820-5
Authors
Yu Hu  University of California, Los Angeles
Zhe Feng  University of California, Los Angeles
Lei He  University of California, Los Angeles
Rupak Majumdar  University of California, Los Angeles
Sponsors
: IEEE CASS/CANDE
: IEEE Council on Electronic Design Automation (CEDA)
SIGDA: ACM Special Interest Group on Design Automation
Publisher
IEEE Press  Piscataway, NJ, USA
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ABSTRACT

We present FPGA logic synthesis algorithms for stochastic fault rate reduction in the presence of both permanent and transient defects. We develop an algorithm for fault tolerant Boolean matching (FTBM), which exploits the flexibility of the LUT configuration to maximize the stochastic yield rate for a logic function. Using FTBM, we propose a robust resynthesis algorithm (ROSE) which maximizes stochastic yield rate for an entire circuit. Finally, we show that existing PLB (programmable logic block) templates for area-aware Boolean matching and logic resynthesis are not effective for fault tolerance, and propose a new robust template with path re-convergence. Compared to the state-of-the-art academic technology mapper Berkeley ABC, ROSE using the proposed robust PLB template reduces the fault rate by 25% with 1% fewer LUTs, and increases MTBF (mean time between failures) by 31%, while preserving the optimal logic depth.


REFERENCES

Note: OCR errors may be found in this Reference List extracted from the full text article. ACM has opted to expose the complete List rather than only correct and linked references.

 
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Collaborative Colleagues:
Yu Hu: colleagues
Zhe Feng: colleagues
Lei He: colleagues
Rupak Majumdar: colleagues