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Efficient and accurate eye diagram prediction for high speed signaling
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International Conference on Computer Aided Design archive
Proceedings of the 2008 IEEE/ACM International Conference on Computer-Aided Design table of contents
San Jose, California
SESSION: Techniques for next generation interconnect modeling table of contents
Pages 655-661  
Year of Publication: 2008
ISBN ~ ISSN:1092-3152 , 978-1-4244-2820-5
Authors
Rui Shi  UC San Diego, La Jolla, CA
Wenjian Yu  Tsinghua University, Beijing, P.R. China
Yi Zhu  UC San Diego, La Jolla, CA
Chung-Kuan Cheng  UC San Diego, La Jolla, CA
Ernest S. Kuh  UC Berkeley, Berkeley, CA
Sponsors
: IEEE CASS/CANDE
: IEEE Council on Electronic Design Automation (CEDA)
SIGDA: ACM Special Interest Group on Design Automation
Publisher
IEEE Press  Piscataway, NJ, USA
Bibliometrics
Downloads (6 Weeks): 3,   Downloads (12 Months): 36,   Citation Count: 1
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ABSTRACT

This paper introduces an accumulative prediction method to predict the eye diagram for high speed signaling systems. We use the step responses of pull-up and pull-down to extract the worst-case eye diagram, including the eye height and jitter. Furthermore, the method produces the input patterns of the worst-case intersymbol interference. The algorithm handles signals of either symmetric or asymmetric rise/fall time. Experimental results demonstrate the accuracy and efficiency of the proposed method.


REFERENCES

Note: OCR errors may be found in this Reference List extracted from the full text article. ACM has opted to expose the complete List rather than only correct and linked references.

 
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H. Zhu, C. K. Cheng, A. Deutsch, and G. Katopis, "Predicting and optimizing jitter and eye-opening based on bitonic step response," in Proc. IEEE EPEP'2007, pp. 155--158, Oct. 2007.
 
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Collaborative Colleagues:
Rui Shi: colleagues
Wenjian Yu: colleagues
Yi Zhu: colleagues
Chung-Kuan Cheng: colleagues
Ernest S. Kuh: colleagues