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Evaluation of voltage interpolation to address process variations
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International Conference on Computer Aided Design archive
Proceedings of the 2008 IEEE/ACM International Conference on Computer-Aided Design table of contents
San Jose, California
SESSION: System-level optimization issues in highly parallel architectures table of contents
Pages 529-536  
Year of Publication: 2008
ISBN ~ ISSN:1092-3152 , 978-1-4244-2820-5
Authors
Kevin Brownell  Harvard University, Cambridge, MA
Gu-Yeon Wei  Harvard University, Cambridge, MA
David Brooks  Harvard University, Cambridge, MA
Sponsors
: IEEE CASS/CANDE
: IEEE Council on Electronic Design Automation (CEDA)
SIGDA: ACM Special Interest Group on Design Automation
Publisher
IEEE Press  Piscataway, NJ, USA
Bibliometrics
Downloads (6 Weeks): 10,   Downloads (12 Months): 36,   Citation Count: 0
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ABSTRACT

Post-fabrication tuning provides a promising design approach to mitigate the performance and power overheads of process variation in advanced fabrication technologies. This paper explores design considerations and VLSI-CAD support for a recently proposed postfabrication tuning knob called voltage interpolation. The paper discusses design tradeoffs between circuit tuning range and static power overheads that can be performed within the synthesis flow of the design process. The paper explores the scheme for a 64-core chip-multiprocessor machine using industrial-grade design blocks and shows that the scheme can be used to mitigate overhead arising from random and correlated within-die process variations. The analysis shows that the scheme can match the nominal delay target with a 10% power cost, or for the same power budget, incur only a 9% delay overhead after variations.


REFERENCES

Note: OCR errors may be found in this Reference List extracted from the full text article. ACM has opted to expose the complete List rather than only correct and linked references.

 
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Collaborative Colleagues:
Kevin Brownell: colleagues
Gu-Yeon Wei: colleagues
David Brooks: colleagues