| A highly efficient optimization algorithm for pixel manipulation in inverse lithography technique |
| Full text |
Pdf
(406 KB)
|
Source
|
International Conference on Computer Aided Design
archive
Proceedings of the 2008 IEEE/ACM International Conference on Computer-Aided Design
table of contents
San Jose, California
SESSION: DFM methods for advanced lithography
table of contents
Pages 480-487
Year of Publication: 2008
ISBN ~ ISSN:1092-3152 , 978-1-4244-2820-5
|
|
Authors
|
|
Jinyu Zhang
|
Tsinghua University, Beijing, China
|
|
Wei Xiong
|
Tsinghua University, Beijing, China
|
|
Yan Wang
|
Tsinghua University, Beijing, China
|
|
Zhiping Yu
|
Tsinghua University, Beijing, China
|
|
Min-Chun Tsai
|
Synopsys Inc., Mountain View, CA
|
|
| Sponsors |
|
| Publisher |
IEEE Press
Piscataway, NJ, USA
|
| Bibliometrics |
Downloads (6 Weeks): 11, Downloads (12 Months): 39, Citation Count: 0
|
|
|
ABSTRACT
An efficient algorithm based on the pixel-based mask representation is proposed for fast synthesis of model-based inverse lithography technology (ILT) to improve the resolution and pattern fidelity in optical lithography. This new algorithm reduces N2 intensity computations to three (3) equivalent intensity computations per iteration, where N2 is the total number of pixels in a mask. This algorithm has been demonstrated using different critical dimensions (CDs) and different mask technologies with incoherence and partial-coherence image models. This algorithm is about 60 times faster and more effective than the current gradient-based algorithm. The final image fidelity has quite a weak dependence on the initial condition. Good fidelity images are achieved when CD is reduced to 45nm.
REFERENCES
Note: OCR errors may be found in this Reference List extracted from the full text article. ACM has opted to expose the complete List rather than only correct and linked references.
| |
1
|
B. E. A. Saleh and S. I. Sayegh, "Reduction of errors of microphotographic reproductions by optimal corrections of original masks", Opt. Eng. 20, 781--787(1981).
|
| |
2
|
S. Sayegh and B. Saleh, Image design: Generation of a prescribed image at the output of a bandlimited system, IEEE Transcation on Pattern Analysis and Machine Intelligence 5, 441--445 (1983).
|
| |
3
|
Sherif Sherif and Bahaa Saleh, "Binary Image Synthesis Using Mixed Linear Integer Programming", IEEE Trans. Image Processing, 4, 1252-- 1257(1995).
|
| |
4
|
Y. Liu and A. Zakhor, "Binary and phase shifting mask design for optical lithography," IEEE Transactionson Semiconductor Manufacturing 5, 138--151(1992).
|
| |
5
|
V. Pati and T. Kailath, "Phase-shifting masks for microlithography: Automated design and mask requirements," Journal of Optical Society of America A - Optics Image Science and Vision 9, 2438--2452 (1994).
|
| |
6
|
Y. Oh, J. C. Lee, and S. Lim, "Resolution enhancement through optical proximity correction and stepper parameter optimization for 0.12-μ m mask pattern", Proc. SPIE 3679, 607--613(1999).
|
| |
7
|
A. Erdmann, R. Farkas, T. Fuhner, B. Tollkuhn, and G. Kokai, "Towards automatic mask and source optimization for optical lithography", Proc. SPIE 5377, 646--657(2004).
|
| |
8
|
Y. Granik, "Solving inverse problems of optical microlithography", Proc. SPIE 5754, 506--526 (2005).
|
| |
9
|
L. Pang, Y. Liu, D. Abrams, "Inverse Lithography Technology (ILT) for Advanced Semiconductor Manufacturing", J. Exp. Mech. 22, 295(2007).
|
| |
10
|
Y. Borodovsky, W. Cheng, R. Schenker, V. Singh, "Pixelated Phase Mask as Novel Lithography RET", Proc. SPIE 6924, 69240E(2008).
|
| |
11
|
A. Poonawala and P. Milanfar, "OPC and PSM design using inverse lithography: A non-linear optimization approach", Proc. SPIE 6154, 61543H1--61543H14(2006).
|
| |
12
|
A. Poonawala and P. Milanfar, "Fast and low-complexity mask design in optical microlithography - an inverse imaging problem", IEEE Trans. on Image Proc. 16 (2007).
|
| |
13
|
Paul S. Davids and Srinivas B. Bollepalli, "Generalized Inverse Problem for Partially Coherent Projection Lithography", Proc. SPIE 6924, 69240X(2008).
|
| |
14
|
W. Huang, C. Lin, C. Kuo, C. Huang, J. Lin, J. Chen, R. Liu, Y. Ku, and B. Lin, "Two threshold resist models for optical proximity correction", Proc. SPIE 5377, 1536--1543(2001).
|
| |
15
|
W. Duch and N. Jankowski, "Survey of neural transfer functions," Computing Surveys 2, 163--213(1999).
|
| |
16
|
C. Kelly, "Iterative Methods for Optimization", SIAM, 1999.
|
|