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Transition-aware decoupling-capacitor allocation in power noise reduction
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International Conference on Computer Aided Design archive
Proceedings of the 2008 IEEE/ACM International Conference on Computer-Aided Design table of contents
San Jose, California
SESSION: Physical design for performance improvement & noise immunity table of contents
Pages 426-429  
Year of Publication: 2008
ISBN ~ ISSN:1092-3152 , 978-1-4244-2820-5
Authors
Po-Yuan Chen  National Tsing Hua University, Hsinchu, Taiwan
Che-Yu Liu  National Tsing Hua University, Hsinchu, Taiwan
TingTing Hwang  National Tsing Hua University, Hsinchu, Taiwan
Sponsors
: IEEE CASS/CANDE
: IEEE Council on Electronic Design Automation (CEDA)
SIGDA: ACM Special Interest Group on Design Automation
Publisher
IEEE Press  Piscataway, NJ, USA
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Downloads (6 Weeks): 1,   Downloads (12 Months): 32,   Citation Count: 0
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ABSTRACT

Dynamic power noises may not only degrade the circuit performance but also reduce the noise margin which may result in the functional errors in integrated circuit. Decoupling capacitor (decap) allocation is one of the most effective way in reducing serious dynamic power noises (hotspots). To allocate decap before placement, we observed that not only locations but also rising time of functional cells are required to accurately predict power noises. Compared to a previous work which only takes neighborhood relation into consideration, our method is more efficient in reducing hotspots. Furthermore, to reduce the hotspots after placement, instead of only using the empty space as proposed in the previous work, we move out cells in the area with serious power noise area (hot area). The obtained empty space can be used to accommodate decaps to further reduce the hotspots. The experimental result shows, compared to the previous work [1], our estimation function to allocate decap before placement is 23% better in reducing power noises. Moreover, compared to a method which fills decaps to all remaining empty space, our cell move algorithm can almost eliminate all the remaining hot grid nodes and hot cells. In summary, compared to the original circuits (without decap), about 60% of hotspots can be removed using our prediction function before placement, and most of the remaining hotspots are removed by our cell moving step after placement.


REFERENCES

Note: OCR errors may be found in this Reference List extracted from the full text article. ACM has opted to expose the complete List rather than only correct and linked references.

 
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H. Su, S. S. Sapatnekar, and S. R. Nassif, "Optimal Decoupling Capacitor Sizing and Placement for Standard-cell Layout Designs," IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, vol. 22, issue 4, pp. 428--436, Apr., 2003.
 
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H. Kriplani, F. N. Najm, and I. N. Hajj, "Pattern Independent Maximum Current Estimation in Power and Ground Buses of CMOS VLSI Circuits: Algorithms, Signal Correlations, and Their Resolution," IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, pp. 998--1012, 1995.
 
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L. T. Pillage, R. A. Rohrer, and C. Visweswariah, "Electronic Circuit and System Simulaton Methods," McGraw-Hill, 1995.
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Collaborative Colleagues:
Po-Yuan Chen: colleagues
Che-Yu Liu: colleagues
TingTing Hwang: colleagues