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Automated test data generation for aspect-oriented programs
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Aspect-oriented software development archive
Proceedings of the 8th ACM international conference on Aspect-oriented software development table of contents
Charlottesville, Virginia, USA
SESSION: Testing and verification table of contents
Pages 185-196  
Year of Publication: 2009
ISBN:978-1-60558-442-3
Authors
Mark Harman  King's College London, London, United Kingdom
Fayezin Islam  T-Zero Processing Services LLC, New York, NY, USA
Tao Xie  North Carolina State University, Raleigh, NC, USA
Stefan Wappler  Berner & Mattner Systemtechnik GmbH, Berlin, Germany
Sponsors
SIGSOFT: ACM Special Interest Group on Software Engineering
SIGPLAN: ACM Special Interest Group on Programming Languages
ACM: Association for Computing Machinery
Publisher
ACM  New York, NY, USA
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ABSTRACT

Despite the upsurge of interest in the Aspect-Oriented Programming (AOP) paradigm, there remain few results on test data generation techniques for AOP. Furthermore, there is no work on search-based optimization for test data generation, an approach that has been shown to be successful in other programming paradigms.

In this paper, we introduce a search-based optimization approach to automated test data generation for structural coverage of AOP systems. We present the results of an empirical study that demonstrates the effectiveness of the approach. We also introduce a domain reduction approach for AOP testing and show that this approach not only reduces test effort, but also increases test effectiveness. This finding is significant, because similar studies for non-AOP programming paradigms show no such improvement in effectiveness, merely a reduction in effort. We also present the results of an empirical study of the reduction in test effort achieved by focusing specifically on branches inside aspects.


REFERENCES

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Collaborative Colleagues:
Mark Harman: colleagues
Fayezin Islam: colleagues
Tao Xie: colleagues
Stefan Wappler: colleagues