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Tradeoffs in system level diagnosis of multiprocessor systems
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Source AFIPS Joint Computer Conferences archive
Proceedings of the July 9-12, 1984, national computer conference and exposition table of contents
Las Vegas, Nevada
SESSION: Computer hardware and architectures table of contents
Pages 173-181  
Year of Publication: 1984
ISBN ~ ISSN:0095-6880 , 0-88283-043-0
Authors
A. Kavianpour  Sharif University of Technology, Tehran, Iran
A. D. Friedman  The George Washington University, Washington D.C.
Sponsor
AFIPS : American Federation of Information Processing Societies
Publisher
ACM  New York, NY, USA
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ABSTRACT

The development of LSI technology makes it possible to partition a system into replaceable modules, and the advent of low-cost microprocessors makes possible networks of hundreds (or more) of interconnected modules. The problem of repairing such a system is becoming a matter of major importance in digital systems.

In this paper a new procedure for defining an optimal design with respect to cost of repair for a system consisting of replaceable modules (processors) is introduced. Also the tradeoff between the number of repetitions of the diagnostic test (speed of diagnosis), the number of testing links in the system (complexity), and the number of replaced fault-free modules (accuracy) is considered.

In an early paper, Preparata, Metze, and Chien4 formulated a model of system level diagnosis and defined two types of diagnosability measures, i.e. one-step t-fault diagnosability, and sequential t-fault diagnosability. They proved that Dδt is one-step t-fault diagnosable and single loop connection is sequentially t-fault diagnosable. Friedman12 later generalized this measure to one-step t-out-of-S (t/S) diagnosability, in which t faults are diagnosed to within S ≥ t modules. This introduces the possibility of inexact diagnosis---i.e. such that some fault-free modules may have to be replaced in order to repair a system in one step.

So far most of the results that are available are only for single-loop or Dδt design, and the results for a system in between these two extreme cases are not available. A Dδt system needs more testing links and a single-loop system needs more steps in order to be repaired. In this paper we have defined a design in between Dδt and single-loop systems; also the tradeoff between the number of repetitions of the diagnostic test (speed of diagnosis), the number of testing links (complexity), and the number of replaced fault-free modules (accuracy) is considered, and the optimal design with respect to cost of repair is defined.


REFERENCES

Note: OCR errors may be found in this Reference List extracted from the full text article. ACM has opted to expose the complete List rather than only correct and linked references.

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Agnew, P. W., D. H. Rutherford, R. J. Suhocki, C. M. Yen, and D. E. Muller. "An Architectural Study for a Self-Repairing Computer." U.S. Space Systems Division, Final Tech. Doc. Rept. SSD-TR-65-159, AD47976, November 1965.
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Preparata, F. P., G. Metze, and R. T. Chien. "On the Connection Assignment Problem of Diagnosable System." IEEE Transactions on Electronic Computers, EC-16, (1967), pp. 848--854.
 
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Preparata, F. P. "Some Results on Sequentially Diagnosable Systems." Proceedings Hawaii International Conference System Science, University of Hawaii Press, 1968, pp. 623--626.
 
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Seshagiri, N. "Completely Self-Diagnosable Digital System." International Journal of Systems Science, 1 (1971), pp. 235--246.
 
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Adham, M., and A. D. Friedman. "Digital System Fault Diagnosis." Journal of Design Automation and Fault-Tolerant Computing, 1 (1977), pp. 115--132.
 
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Friedman, A. D. "A New Measure of Digital System Fault Diagnosis." Digest 1975 International Symposium Fault-Tolerant Computing. IEEE Computer Society Publications, 1975, pp. 167--170.
 
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Karunanithi, S., and A. D. Friedman. "System Diagnosis with t/S Diagnosability." Digest 1977 International Symposium Fault-Tolerant Computing. IEEE Computer Society Publications, 1977, pp. 65--71.
 
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Kavianpour, A., and A. D. Friedman. "Design of Easily Diagnosable System." Third USA-JAPAN Computer Conference, 1978, San Francisco.
 
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Kavianpour, A. "Diagnosis of Digital System using t/S Measure." Doctoral dissertation, University of Southern California, Los Angeles, June 1978.
 
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Kavianpour, A., and A. D. Friedman. "Different Diagnostic Models for Multiprocessor System." 8th World Computer Congress, IFIP, October 1980.
Collaborative Colleagues:
A. Kavianpour: colleagues
A. D. Friedman: colleagues