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Perfect matchings via uniform sampling in regular bipartite graphs
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Source Symposium on Discrete Algorithms archive
Proceedings of the Nineteenth Annual ACM -SIAM Symposium on Discrete Algorithms table of contents
New York, New York
Pages 11-17  
Year of Publication: 2009
Authors
Ashish Goel  Stanford University
Michael Kapralov  Stanford University
Sanjeev Khanna  University of Pennsylvania, Philadelphia PA
Publisher
Society for Industrial and Applied Mathematics  Philadelphia, PA, USA
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ABSTRACT

In this paper we further investigate the well-studied problem of finding a perfect matching in a regular bipartite graph. The first non-trivial algorithm, with running time O(mn), dates back to König's work in 1916 (here m = nd is the number of edges in the graph, 2n is the number of vertices, and d is the degree of each node). The currently most efficient algorithm takes time O(m), and is due to Cole, Ost, and Schirra. We improve this running time to O(min{m, n2.5ln n/d}); this minimum can never be larger than O(n1.75√ln n). We obtain this improvement by proving a uniform sampling theorem: if we sample each edge in a d-regular bipartite graph independently with a probability p = O(n ln n/d2) then the resulting graph has a perfect matching with high probability. The proof involves a decomposition of the graph into pieces which are guaranteed to have many perfect matchings but do not have any small cuts. We then establish a correspondence between potential witnesses to non-existence of a matching (after sampling) in any piece and cuts of comparable size in that same piece. Karger's sampling theorem for preserving cuts in a graph can now be adapted to prove our uniform sampling theorem for preserving perfect matchings. Using the O(mn) algorithm (due to Hopcroft and Karp) for finding maximum matchings in bipartite graphs on the sampled graph then yields the stated running time. We also provide an infinite family of instances to show that our uniform sampling result is tight up to poly-logarithmic factors (in fact, up to ln2 n).


REFERENCES

Note: OCR errors may be found in this Reference List extracted from the full text article. ACM has opted to expose the complete List rather than only correct and linked references.

 
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Collaborative Colleagues:
Ashish Goel: colleagues
Michael Kapralov: colleagues
Sanjeev Khanna: colleagues