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Design of a fault-tolerant, modular computer with dynamic redundancy
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Source AFIPS Joint Computer Conferences archive
Proceedings of the December 5-7, 1972, fall joint computer conference, part II table of contents
Anaheim, California
SESSION: Impact of new technology on architecture table of contents
Pages 1057-1067  
Year of Publication: 1972
Authors
Ralph B. Conn  Ultrasystems, Incorporated, Newport Beach, California
Nikitas A. Alexandridis  Ultrasystems, Incorporated, Newport Beach, California
Algirdas Avižienis  University of California, Los Angeles, California
Sponsor
AFIPS : American Federation of Information Processing Societies
Publisher
ACM  New York, NY, USA
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Downloads (6 Weeks): 2,   Downloads (12 Months): 13,   Citation Count: 1
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ABSTRACT

This paper presents the results of a design study for a Modular Spacecraft Computer (MSC). The MSC is a fault-tolerant computer that is designed to preserve the continuity and correctness of its programs in the presence of both transient malfunctions and permanent failures in its hardware. The MSC is designed to detect and to implement recovery from faults without external assistance. The fault-tolerance goals are to provide a reliability of 0.95 for a five-year period of unattended operation and to provide recovery from a specified class of repetitive transient malfunctions, bounded by maximum repetition rate and maximum duration specifications, during that time period.


REFERENCES

Note: OCR errors may be found in this Reference List extracted from the full text article. ACM has opted to expose the complete List rather than only correct and linked references.

 
1
R A Short The attainment of reliable digital systems through the use of redundancy---A survey IEEE Computer Group News Vol 2 No 2 1968
 
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W C Carter et al Design techniques for modular architecture for reliable computer systems Report No 70-208-0002 IBM Space Systems Center Huntsville, Alabama 1970
 
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I S Reed D E Brimley On increasing the operating life of unattended machines RM-3338-PR The RAND Corporation 1962
 
7
W G Tees Predicting failure rates of yield-enhanced LSI Computer Design February 1971
 
8
D M Aaron M F Adam MOS reliability prediction model Ninth Reliability and Maintainability Conference 1970
 
9
R L Cunningham High reliability beam-lead devices WESCON Session 20 1971
 
10
C M Ryerson et al RADC reliability notebook volume II RADC-TR-67-108 September 1967
 
11
F P Mathur Reliability estimation procedures and CARE: The computer-aid reliability estimation program Jet Propulsion Laboratories Quarter Technical Review Vol 1 1971

Collaborative Colleagues:
Ralph B. Conn: colleagues
Nikitas A. Alexandridis: colleagues
Algirdas Avižienis: colleagues