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Metric-based ontology learning
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Conference on Information and Knowledge Management archive
Proceeding of the 2nd international workshop on Ontologies and nformation systems for the semantic web table of contents
Napa Valley, California, USA
SESSION: Session 1 table of contents
Pages 1-8  
Year of Publication: 2008
ISBN:978-1-60558-255-9
Authors
Hui Yang  Carnegie Mellon University, Pittsburgh, PA, USA
Jamie Callan  Carnegie Mellon University, Pittsburgh, PA, USA
Sponsors
ACM: Association for Computing Machinery
SIGWEB: ACM Special Interest Group on Hypertext, Hypermedia, and Web
SIGIR: ACM Special Interest Group on Information Retrieval
Publisher
ACM  New York, NY, USA
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ABSTRACT

Ontology learning is an important task in Artificial Intelligence, Semantic Web and Text Mining. This paper presents a novel framework for, and solutions to, three practical problems in ontology learning. An incremental clustering approach is used to solve the problem of unknown group names. Learned models at each level of an ontology address the problem of no control over concept abstractness. A metric learning module moves beyond the limitation of traditional use of features and incorporates heterogeneous semantic evidence into the learning process. The metric-based learning framework integrates these separate components into a single, unified solution. An extensive evaluation with WordNet and Open Directory Project data demonstrates that the method is more effective than a state-of-the-art baseline algorithm.


REFERENCES

Note: OCR errors may be found in this Reference List extracted from the full text article. ACM has opted to expose the complete List rather than only correct and linked references.

 
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