You can catch more bugs with transaction level honey

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You can catch more bugs with transaction level honey

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International Conference on Hardware Software Codesign archive
Proceedings of the 6th IEEE/ACM/IFIP international conference on Hardware/Software codesign and system synthesis table of contents

Atlanta, GA, USA

SESSION: Special Session 1 table of contents

Pages 121-124

Year of Publication: 2008

ISBN:978-1-60558-470-6

Authors

Miron Abramovici	DAFCA, Framingham, MA, USA
Kees Goossens	NXP Semiconductor, Netherlands
Bart Vermeulen	NXP Semiconductor, Netherlands
Jack Greenbaum	Greenhills Software, CA, USA
Neal Stollon	HDL Dynamics, TX, USA
Adam Donlin	Xilinx, San Jose, CA, USA

Sponsors

SIGDA: ACM Special Interest Group on Design Automation
SIGBED: ACM Special Interest Group on Embedded Systems
ACM: Association for Computing Machinery
SIGMICRO: ACM Special Interest Group on Microarchitectural Research and Processing

Publisher

ACM New York, NY, USA

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ABSTRACT

In this special session we explore holistic approaches to hardware/software debug that use or integrate transaction level models (TLMs). We present several TLM-based approaches to system-level diagnostics, ranging from use of most popular transaction level modeling languages through to hybrid technologies that combine TLMs with other well known diagnostic tools like in-silicon trace logic.

INDEX TERMS

Primary Classification:
C. Computer Systems Organization
C.5 COMPUTER SYSTEM IMPLEMENTATION
C.5.0 General