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Deterministic service guarantees for nand flash using partial block cleaning
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International Conference on Hardware Software Codesign archive
Proceedings of the 6th IEEE/ACM/IFIP international conference on Hardware/Software codesign and system synthesis table of contents
Atlanta, GA, USA
SESSION: Flash memory management table of contents
Pages 19-24  
Year of Publication: 2008
ISBN:978-1-60558-470-6
Authors
Siddharth Choudhuri  Center for Embedded Computer Systems, Irvine, CA, USA
Tony Givargis  Center for Embedded Computer Systems, Irvine, CA, USA
Sponsors
SIGDA: ACM Special Interest Group on Design Automation
SIGBED: ACM Special Interest Group on Embedded Systems
ACM: Association for Computing Machinery
SIGMICRO: ACM Special Interest Group on Microarchitectural Research and Processing
Publisher
ACM  New York, NY, USA
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ABSTRACT

NAND flash idiosyncrasies such as bulk erase and wear leveling results in non-linear and unpredictable read/write access times. In case of application domains such as streaming multimedia and real-time systems, a deterministic read/write access time is desired during design time. We propose a novel NAND flash translation layer called GFTL that guarantees fixed upper bounds (i.e., worst case service rates) for reads and writes that are comparable to a theoretical ideal case. Such guarantees are made possible by eliminating sources of non-determinism in GFTL design and using partial block cleaning. GFTL performs garbage collection in partial steps by dividing the garbage collection of a single block into several chunks, thereby interleaving and hiding the garbage collection latency while servicing requests.

Further, GFTL guarantees are independent of flash utilization, size or state. Along with theoretical bounds, benchmark results show the efficacy of our approach. Based on our experiments, GFTL requires an additional 16% of total blocks for flash management. GFTL service guarantees can be calculated from flash specifications. Thus, with GFTL, a designer can determine the service guarantees and size requirements apriori, during design time.


REFERENCES

Note: OCR errors may be found in this Reference List extracted from the full text article. ACM has opted to expose the complete List rather than only correct and linked references.

 
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Collaborative Colleagues:
Siddharth Choudhuri: colleagues
Tony Givargis: colleagues