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Non-intrusive dynamic application profiler for detailed loop execution characterization
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International Conference on Compilers, Architecture and Synthesis for Embedded Systems archive
Proceedings of the 2008 international conference on Compilers, architectures and synthesis for embedded systems table of contents
Atlanta, GA, USA
SESSION: Compiler hardware interaction table of contents
Pages 23-30  
Year of Publication: 2008
ISBN:978-1-60558-469-0
Authors
Ajay Nair  University of Arizona, Tucson, AZ, USA
Roman Lysecky  University of Arizona, Tucson, AZ, USA
Sponsors
SIGDA: ACM Special Interest Group on Design Automation
ACM: Association for Computing Machinery
SIGBED: ACM Special Interest Group on Embedded Systems
SIGMICRO: ACM Special Interest Group on Microarchitectural Research and Processing
Publisher
ACM  New York, NY, USA
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ABSTRACT

Application profiling - the process of monitoring an application to determine the frequency of execution within specific regions - is an essential step within the design process for many software and hardware systems. In this paper, we present an efficient innovative, non-intrusive dynamic application profiler (DAProf) capable of profiling an executing application by monitoring the application's short backwards branches and providing detailed profiling statistics for characterizing loop execution behavior. DAProf is ideally suited for hardware/software partitioning approaches in which detailed loop execution information is needed to provide accurate performance estimates. DAProf provides a profiling accuracy of greater than 90% with only an 11% area overhead compared to a small ARM9.


REFERENCES

Note: OCR errors may be found in this Reference List extracted from the full text article. ACM has opted to expose the complete List rather than only correct and linked references.

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Villarreal, J., R. Lysecky, S. Cotterell, F. Vahid. Loop Analysis of Embedded Applications. UCR Techn. Report UCR-CSE-01-03, 2001.
 
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Collaborative Colleagues:
Ajay Nair: colleagues
Roman Lysecky: colleagues