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A defect-driven process for software quality improvement
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Proceedings of the Second ACM-IEEE international symposium on Empirical software engineering and measurement table of contents
Kaiserslautern, Germany
SESSION: Experience in process improvement table of contents
Pages: 333-335  
Year of Publication: 2008
ISBN:978-1-59593-971-5
Authors
Brian Robinson  ABB Corporate Research, Raleigh, NC, USA
Patrick Francis  ABB Corporate Research, Raleigh, NC, USA
Fredrik Ekdahl  ABB Robotics, Västerås, Sweden
Sponsors
SIGSOFT: ACM Special Interest Group on Software Engineering
ACM: Association for Computing Machinery
Publisher
ACM  New York, NY, USA
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ABSTRACT

Software quality improvement initiatives are frequently attempted inside major software development companies. These initiatives often face difficulty motivating managers and developers. Yet the success of these improvement initiatives is directly related to receiving support from them. A defect-driven improvement process is proposed, aiming to improve the adoption of techniques by these key groups. The process is based on using defect data to identify issues in the current development process. ABB has used this process to focus and motivate change in three major development organizations around the world. Results show that this process yields measurable improvements in organizations that have been reluctant to change in the past.


REFERENCES

Note: OCR errors may be found in this Reference List extracted from the full text article. ACM has opted to expose the complete List rather than only correct and linked references.

 
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IEEE. IEEE standard classification for software anomalies. IEEE Std 1044--1993. 2 Jun 1994
 
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Collaborative Colleagues:
Brian Robinson: colleagues
Patrick Francis: colleagues
Fredrik Ekdahl: colleagues