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Evaluation of capture-recapture models for estimating the abundance of naturally-occurring defects
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Proceedings of the Second ACM-IEEE international symposium on Empirical software engineering and measurement table of contents
Kaiserslautern, Germany
SESSION: Inspections table of contents
Pages 158-167  
Year of Publication: 2008
ISBN:978-1-59593-971-5
Authors
Gursimran Singh Walia  Mississippi State University, Starkville, MS, USA
Jeffrey C. Carver  University of Alabama, Tuscaloosa, AL, USA
Sponsors
SIGSOFT: ACM Special Interest Group on Software Engineering
ACM: Association for Computing Machinery
Publisher
ACM  New York, NY, USA
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ABSTRACT

Project managers can use capture-recapture models to manage the inspection process by estimating the number of defects present in an artifact and determining whether a reinspection is necessary. Researchers have previously evaluated capture-recapture models on artifacts with a known number of defects. Before applying capture-recapture models in real development, an evaluation of those models on naturally-occurring defects is imperative. The data in this study is drawn from two inspections of real requirements documents (that later guided implementation) created as part of a capstone course (i.e. with naturally occurring defects). The major results show that: a) estimators improve from being negatively biased after one inspection to being positively biased after two inspections, b) the results contradict the earlier result that a model that includes two sources of variation is a significant improvement over models with one source of variation, and c) estimates are useful in determining the need for artifact reinspection.


REFERENCES

Note: OCR errors may be found in this Reference List extracted from the full text article. ACM has opted to expose the complete List rather than only correct and linked references.

 
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Collaborative Colleagues:
Gursimran Singh Walia: colleagues
Jeffrey C. Carver: colleagues