Defect categorization

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Defect categorization: making use of a decade of widely varying historical data

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Proceedings of the Second ACM-IEEE international symposium on Empirical software engineering and measurement table of contents

Kaiserslautern, Germany

SESSION: Inspections table of contents

Pages 149-157

Year of Publication: 2008

ISBN:978-1-59593-971-5

Authors

Carolyn B. Seaman	Fraunhofer Center for Experimental Software Engineering and University of Maryland Baltimore County, College Park, MD, USA
Forrest Shull	Fraunhofer Center for Experimental Software Engineering, College Park, MD, USA
Myrna Regardie	Fraunhofer Center for Experimental Software Engineering, College Park, MD, USA
Denis Elbert	Fraunhofer Center for Experimental Software Engineering, College Park, MD, USA
Raimund L. Feldmann	Fraunhofer Center for Experimental Software Engineering, College Park, MD, USA
Yuepu Guo	University of Maryland Baltimore County, Baltimore, MD, USA
Sally Godfrey	NASA Goddard Space Flight Center, Greenbelt, MD, USA

Sponsors

SIGSOFT: ACM Special Interest Group on Software Engineering
ACM: Association for Computing Machinery

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ACM New York, NY, USA

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ABSTRACT

This paper describes our experience in aggregating a number of historical datasets containing inspection defect data using different categorization schemes. Our goal was to make use of the historical data by creating models to guide future development projects. We describe our approach to reconciling the different choices used in the historical datasets to categorize defects, and the challenges we faced. We also present a set of recommendations for others involved in classifying defects.

REFERENCES

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