ACM Home Page
Please provide us with feedback. Feedback
Sizing CMOS circuits by means of the gm/ID methodology and a compact model
Full text PdfPdf (139 KB)
Source
SBCCI archive
Proceedings of the 21st annual symposium on Integrated circuits and system design table of contents
Gramado, Brazil
TUTORIAL SESSION: Tutorials table of contents
Pages 1-1  
Year of Publication: 2008
ISBN:978-1-60558-231-3
Author
Paul Jespers  Université Catholique de Louvain, Louvain-la-neuve, Belgium
Sponsors
ACM: Association for Computing Machinery
SIGDA: ACM Special Interest Group on Design Automation
Publisher
ACM  New York, NY, USA
Bibliometrics
Downloads (6 Weeks): 21,   Downloads (12 Months): 123,   Citation Count: 0
Additional Information:

abstract   index terms   collaborative colleagues  

Tools and Actions: Review this Article  
DOI Bookmark: Use this link to bookmark this Article: http://doi.acm.org/10.1145/1404371.1404373
What is a DOI?

ABSTRACT

The gm/ID sizing methodology. Sizing the Intrinsic Gain Stage by means of experimental data or a model like the E.K.V./A.C.M. model. Sizing short channel devices with parameters that are functions of bias conditions. Parameter acquisition, accuracy, examples. Application to the sizing of low-power low-voltage CMOS circuits like the Miller Op. Amp, Barranco's current sources, etc.