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Structured metric learning for high dimensional problems
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International Conference on Knowledge Discovery and Data Mining archive
Proceeding of the 14th ACM SIGKDD international conference on Knowledge discovery and data mining table of contents
Las Vegas, Nevada, USA
SESSION: Research papers table of contents
Pages: 195-203  
Year of Publication: 2008
ISBN:978-1-60558-193-4
Authors
Jason V. Davis  University of Texas at Austin, Austin, TX, USA
Inderjit S. Dhillon  University of Texas at Austin, Austin, TX, USA
Sponsors
ACM: Association for Computing Machinery
SIGKDD: ACM Special Interest Group on Knowledge Discovery in Data
SIGMOD: ACM Special Interest Group on Management of Data
Publisher
ACM  New York, NY, USA
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ABSTRACT

The success of popular algorithms such as k-means clustering or nearest neighbor searches depend on the assumption that the underlying distance functions reflect domain-specific notions of similarity for the problem at hand. The distance metric learning problem seeks to optimize a distance function subject to constraints that arise from fully-supervised or semisupervised information. Several recent algorithms have been proposed to learn such distance functions in low dimensional settings. One major shortcoming of these methods is their failure to scale to high dimensional problems that are becoming increasingly ubiquitous in modern data mining applications. In this paper, we present metric learning algorithms that scale linearly with dimensionality, permitting efficient optimization, storage, and evaluation of the learned metric. This is achieved through our main technical contribution which provides a framework based on the log-determinant matrix divergence which enables efficient optimization of structured, low-parameter Mahalanobis distances. Experimentally, we evaluate our methods across a variety of high dimensional domains, including text, statistical software analysis, and collaborative filtering, showing that our methods scale to data sets with tens of thousands or more features. We show that our learned metric can achieve excellent quality with respect to various criteria. For example, in the context of metric learning for nearest neighbor classification, we show that our methods achieve 24% higher accuracy over the baseline distance. Additionally, our methods yield very good precision while providing recall measures up to 20% higher than other baseline methods such as latent semantic analysis.


REFERENCES

Note: OCR errors may be found in this Reference List extracted from the full text article. ACM has opted to expose the complete List rather than only correct and linked references.

 
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S. C. Deerwester, S. T. Dumais, T. K. Landauer, G.W. Furnas, and R. A. Harshman. Indexing by latent semantic analysis. Journal of the American Society of Information Science, 41(6):391--407, 1990.
 
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A. Globerson and S. Roweis. Metric Learning by Collapsing Classes. In NIPS, 2005
 
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G.H. Golub and C.F. Van Loan. Matrix Computations. Johns Hopkins University Press, Baltimore, MD, second edition, 1989.
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K. Q. Weinberger, J. Blitzer, and L. K. Saul. Distance Metric Learning for Large Margin Nearest Neighbor Classification. In NIPS, 2005.
 
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E. P. Xing, A. Y. Ng, M. I. Jordan, and S. Russell. Distance metric learning with application to clustering with side-information. In NIPS, 2002.


Collaborative Colleagues:
Jason V. Davis: colleagues
Inderjit S. Dhillon: colleagues