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An expected-utility based approach to variation aware VLSI optimization under scarce information
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International Symposium on Low Power Electronics and Design archive
Proceeding of the 13th international symposium on Low power electronics and design table of contents
Bangalore, India
SESSION: Variability-aware optimization table of contents
Pages 81-86  
Year of Publication: 2008
ISBN:978-1-60558-109-5
Authors
Upavan Gupta  University of South Florida, Tampa, FL, USA
Nagarajan Ranganathan  University of South Florida, Tampa, FL, USA
Sponsors
ACM: Association for Computing Machinery
SIGDA: ACM Special Interest Group on Design Automation
Publisher
ACM  New York, NY, USA
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ABSTRACT

In this research, we propose a novel approach for simultaneous optimization of power, crosstalk noise and delay via gate sizing, in the presence of scarce information about the distribution of the variations. The methodology uses the concepts of utility theory and risk minimization to identify a deterministic equivalent model of the stochastic problem, ensuring high levels of expected utilities of constraints, and significant speedup in the optimization process for large circuits. A comparative study with an existing gate sizing methodology shows that our method is multi-fold faster as well as comparable in terms of the optimization.


REFERENCES

Note: OCR errors may be found in this Reference List extracted from the full text article. ACM has opted to expose the complete List rather than only correct and linked references.

 
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Collaborative Colleagues:
Upavan Gupta: colleagues
Nagarajan Ranganathan: colleagues