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Modeling crosstalk in statistical static timing analysis
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Source Annual ACM IEEE Design Automation Conference archive
Proceedings of the 45th annual Design Automation Conference table of contents
Anaheim, California
SESSION: Noise reliability enhancement table of contents
Pages 974-979  
Year of Publication: 2008
ISBN ~ ISSN:0738-100X , 978-1-60558-115-6
Authors
Ravikishore Gandikota  University of Michigan, Ann Arbor MI
David Blaauw  University of Michigan, Ann Arbor MI
Dennis Sylvester  University of Michigan, Ann Arbor MI
Sponsors
SIGDA: ACM Special Interest Group on Design Automation
: IEEE/CASS/CANDE/CEDA
: The EDA Consortium
Publisher
ACM  New York, NY, USA
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ABSTRACT

Increasing process variation in the nanometer regime motivates the use of statistical static timing analysis tools for timing verification. As device dimensions get smaller, signal integrity effects such as crosstalk noise become more significant. Therefore, it is necessary to accurately model the impact of crosstalk noise on the circuit delay. Process variations cause variability in the crosstalk alignment which leads to the variability in the delay noise. However, most of the existing approaches model delay noise as a worst-case deterministic quantity. In this work, we capture the variability of delay noise by first deriving the closed-form expressions of mean and standard deviation of the delay noise distribution. Next, we obtain the correlation information of the delay noise and use it to represent the delay noise distribution in canonical form. Delay noise, in canonical form, can easily be integrated with existing SSTA tools. We show experimental results that verify the accuracy of our approach.


REFERENCES

Note: OCR errors may be found in this Reference List extracted from the full text article. ACM has opted to expose the complete List rather than only correct and linked references.

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A. Agarwal, D. Blaauw, and V. Zolotov, "Statistical timing analysis using bounds and selective enumeration," in IEEE Trans. on Computer-Aided Design of Integrated Circuits and Systems, pp. 1243--1260, 2003.
 
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T. Sato, Y. Cao, D. Sylvester and C. Hu, "Characterization of Interconnect Coupling Noise using In-situ Delay Change Curve Measurements," in Proc. of IEEE ASIC/SOC Conference, pp. 321--325, 2000.
 
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K. Agarwal, M. Agarwal, D. Sylvester and D. Blaauw, "Statistical Interconnect Metrics for Physical Design Optimization" in IEEE Trans. of Computer Aided Design of Integrated Circuits and Systems, pp. 1273--1288, 2006.
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A. Papoulis, S. U. Pillai, "Probability, Random Variables and Stochastic Processes", ISBN 0073660116, 4th edition, 2002.
 
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Collaborative Colleagues:
Ravikishore Gandikota: colleagues
David Blaauw: colleagues
Dennis Sylvester: colleagues