| Circuit and microarchitecture evaluation of 3D stacking magnetic RAM (MRAM) as a universal memory replacement |
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Annual ACM IEEE Design Automation Conference
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Proceedings of the 45th annual Design Automation Conference
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Anaheim, California
SESSION: Beyond the die - packaging and die stacking
table of contents
Pages 554-559
Year of Publication: 2008
ISBN ~ ISSN:0738-100X , 978-1-60558-115-6
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Authors
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Xiangyu Dong
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Pennsylvania State University, University Park, PA
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Xiaoxia Wu
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Pennsylvania State University, University Park, PA
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Guangyu Sun
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Pennsylvania State University, University Park, PA
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Yuan Xie
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Pennsylvania State University, University Park, PA
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Helen Li
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Seagate Technology, Bloomington, MN
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Yiran Chen
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Seagate Technology, Bloomington, MN
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Downloads (6 Weeks): 26, Downloads (12 Months): 159, Citation Count: 3
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ABSTRACT
Magnetic Random Access Memory (MRAM) has been considered as a promising memory technology due to many attractive properties. Integrating MRAM with CMOS logic may incur extra manufacture cost, due to its hybrid magnetic-CMOS fabrication process. Stacking MRAM on top of CMOS logics using 3D integration is a way to minimize this cost overhead. In this paper, we discuss the circuit design issues for MRAM, and present the MRAM cache model. Based on the model, we compare MRAM against SRAM and DRAM in terms of area, performance, and energy. Finally we conduct architectural evaluation for 3D microprocessor stacking with MRAM. The experimental results show that MRAM stacking offers competitive IPC performance with a large reduction in power consumption compared to SRAM and DRAM counterparts.
REFERENCES
Note: OCR errors may be found in this Reference List extracted from the full text article. ACM has opted to expose the complete List rather than only correct and linked references.
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