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Automated design of self-adjusting pipelines
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Source Annual ACM IEEE Design Automation Conference archive
Proceedings of the 45th annual Design Automation Conference table of contents
Anaheim, California
SESSION: Variation-aware design table of contents
Pages 211-216  
Year of Publication: 2008
ISBN ~ ISSN:0738-100X , 978-1-60558-115-6
Authors
Jieyi Long  Northwestern University, Evanston, IL
Seda Ogrenci Memik  Northwestern University, Evanston, IL
Sponsors
SIGDA: ACM Special Interest Group on Design Automation
: IEEE/CASS/CANDE/CEDA
: The EDA Consortium
Publisher
ACM  New York, NY, USA
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ABSTRACT

We propose a self-adjusting pipeline structure to enhance chip performance and robustness considering the effects of process variations. We achieve this by introducing delay sensors to monitor internal timing violations within a pipeline stage and variable clock skew buffers to adjust the timing of the pipeline stage based on the feedback from the delay sensors. Furthermore, we formulate the delay sensor insertion and variable clock skew configuration problem as a stochastic mixed-integer programming problem and propose a simulated-annealing based algorithm to solve it. A comparison between the designs with and without the self-adjusting enhancement reveals that, we are able to improve the average performance of a batch of chips by 9.5%.


REFERENCES

Note: OCR errors may be found in this Reference List extracted from the full text article. ACM has opted to expose the complete List rather than only correct and linked references.

 
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Duraisami, K., et al. Design Exploration of a Thermal Management Unit for Dynamic Control of Temperature-Induced Clock Skew. in Int. Symp. on Circuits and Systems. 2007.
 
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Bowman, K. A., S. G. Duvall, and J. D. Meindl, Impact of Die-to-Die and Within-Die Parameter Fluctuations on the Maximum Clock Frequency Distribution for Gigascale Integration. IEEE Journal of Solid-State Circuits, 2002. 37(2).
 
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Das, A., et al. Mitigating the Effects of Process Variations: Architectural Approaches for Improving Batch Performances. in Workshop on Architectural Support for Gigascale Integration. 2007.
 
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Ghosh, S., et al., A Novel Delay Fault Testing Methodology using Low-Overhead Built-In Delay Sensor. IEEE Trans. on Computer-Aided Design of Integrated Circuits and Systems, 2007. 25(12).
 
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Kargupta, H. and D. E. Goldberg. SEARCH, Blackbox Optimization, and Sample Complexity. in Foundation of Genetic Algorithm. 1997.

Collaborative Colleagues:
Jieyi Long: colleagues
Seda Ogrenci Memik: colleagues