Reliability considerations in mobile devices

ABSTRACT

The problem of reliability in current chips has been the subject of numerous researchers. Mobile devices, commonly used in multimedia communications require low power during both normal operation and testing. In this paper a novel algorithm is presented for embedding test sets containing don't care values into sequences generated by binary counters. Therefore, both test time and power consumed during testing of the chips can be considerably reduced.

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INDEX TERMS

Keywords:
low power testing, mobile device reliability