| Using reiterative LFSR based X-masking to increase output compression in presence of unknowns |
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Great Lakes Symposium on VLSI
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Proceedings of the 18th ACM Great Lakes symposium on VLSI
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Orlando, Florida, USA
POSTER SESSION: Poster session 2
table of contents
Pages: 355-358
Year of Publication: 2008
ISBN:978-1-59593-999-9
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Author
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Richard Putman
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Cirrus Logic (also University of Texas at Austin), Austin, TX, USA
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Downloads (6 Weeks): 2, Downloads (12 Months): 26, Citation Count: 0
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ABSTRACT
This paper addresses the problem of increasing unknowns in the output response data by exploring reiterative LFSR reseeding based X-masking. This approach takes advantage of the data correlation in the output response data to enable LFSR encoded masks to be reused for multiple scan slices while guaranteeing that all unknowns are masked and all bits required for fault detection are allowed to propagate to the compactor. This paper also investigates a hybrid approach that combines conventional LFSR reseeding based X-masking with fixed-interval reiterative LFSR X-masking. Experimental results for applying this approach to industrial designs indicate that significant amounts of output compression can be achieved without any pattern count inflation or loss in fault coverage.
REFERENCES
Note: OCR errors may be found in this Reference List extracted from the full text article. ACM has opted to expose the complete List rather than only correct and linked references.
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Carl Barnhart , Vanesa Brunkhorst , Frank Distler , Owen Farnsworth , Brion L. Keller , Bernd Koenemann , Andrej Ferko, OPMISR: the foundation for compressed ATPG vectors, Proceedings of the IEEE International Test Conference 2001, p.748-757, October 30-November 01, 2001
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Wohl, P., J.A. Waicukauski, S. Patel, and M.B. Amin, "X-Tolerant Compression and Application of Scan-ATPG Patterns in a BIST Architecture," Proc. of International Test Conference, pp. 727-736, 2003.
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Naruse, M., I. Pomeranz, S.M. Reddy, and S. Kundu, "On-Chip Compression of Output Responses with Unknown Values Using LFSR Reseeding," Proc. of International Test Conference, pp. 1060-1068, 2003.
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M. C. -T. Chao , Seongmoon Wang , S. T. Chakradhar , Kwang-Ting Cheng, Response shaper: a novel technique to enhance unknown tolerance for output response compaction, Proceedings of the 2005 IEEE/ACM International conference on Computer-aided design, p.80-87, November 06-10, 2005, San Jose, CA
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Mitra, S., and K.S. Kim, "X-Compact: An Efficient Response Compaction Scheme," IEEE Trans. on Computer-Aided Design, Vol. 23, No. 3, pp. 421-432, Mar. 2004.
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Rajski, J., J. Tyszer, C. Wang, and S.M. Reddy, "Finite Memory Test Response Compactors for Embedded Test Applications," IEEE Trans. on Computer-Aided Design, Vol. 24, No. 4, pp. 622-634, Apr. 2005.
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Touba, N.A., "X-Canceling MISR -- An X-Tolerant Methodology for Compacting Output Responses with Unknowns Using a MISR," Proc. of International Test Conference, Paper 6.2, 2007.
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INDEX TERMS
Primary Classification:
B.
Hardware
B.8
Performance and Reliability
B.8.1
Reliability, Testing, and Fault-Tolerance
General Terms:
Algorithms,
Design,
Economics,
Experimentation,
Measurement,
Performance,
Reliability,
Theory
Keywords:
LFSR,
compression,
reiterative,
x-masking
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