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Using reiterative LFSR based X-masking to increase output compression in presence of unknowns
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Source
Great Lakes Symposium on VLSI archive
Proceedings of the 18th ACM Great Lakes symposium on VLSI table of contents
Orlando, Florida, USA
POSTER SESSION: Poster session 2 table of contents
Pages: 355-358  
Year of Publication: 2008
ISBN:978-1-59593-999-9
Author
Richard Putman  Cirrus Logic (also University of Texas at Austin), Austin, TX, USA
Sponsors
SIGDA: ACM Special Interest Group on Design Automation
ACM: Association for Computing Machinery
Publisher
ACM  New York, NY, USA
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ABSTRACT

This paper addresses the problem of increasing unknowns in the output response data by exploring reiterative LFSR reseeding based X-masking. This approach takes advantage of the data correlation in the output response data to enable LFSR encoded masks to be reused for multiple scan slices while guaranteeing that all unknowns are masked and all bits required for fault detection are allowed to propagate to the compactor. This paper also investigates a hybrid approach that combines conventional LFSR reseeding based X-masking with fixed-interval reiterative LFSR X-masking. Experimental results for applying this approach to industrial designs indicate that significant amounts of output compression can be achieved without any pattern count inflation or loss in fault coverage.


REFERENCES

Note: OCR errors may be found in this Reference List extracted from the full text article. ACM has opted to expose the complete List rather than only correct and linked references.

 
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