| Variational capacitance modeling using orthogonal polynomial method |
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Great Lakes Symposium on VLSI
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Proceedings of the 18th ACM Great Lakes symposium on VLSI
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Orlando, Florida, USA
SESSION: Session 1A: Modeling and Design under Variations
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Pages 23-28
Year of Publication: 2008
ISBN:978-1-59593-999-9
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Authors
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Jian Cui
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University of California, Riverside, Riverside, CA, USA
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Gengsheng Chen
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Fudan University, Shanghai, China
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Ruijing Shen
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University of California, Riverside, Riverside, CA, USA
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Sheldon Tan
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University of California, Riverside, Riverside, CA, USA
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Wenjian Yu
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Tsinghua University, Beijing, China
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Jiarong Tong
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Fudan University, Shanghai, China
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Downloads (6 Weeks): 8, Downloads (12 Months): 52, Citation Count: 0
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ABSTRACT
In this paper, we propose a novel statistical capacitance extraction method for interconnects considering process variations. The new method, called statCap, is based on the spectral stochastic method where orthogonal polynomials are used to represent the statistical processes in a deterministic way. We first show how the variational potential coefficient matrix is represented in a first-order form using Taylor expansion and orthogonal decomposition. Then an augmented potential coefficient matrix, which consists of the coefficients of the polynomials, is derived. After that, corresponding augmented system is solved to obtain the variational capacitance values in the orthogonal polynomial form. Experimental results show that our method is two orders of magnitude faster than the recently proposed statistical capacitance extraction method based on the spectral stochastic collocation approach and many orders of magnitude faster than the Monte Carlo method for several practical interconnect structures.
REFERENCES
Note: OCR errors may be found in this Reference List extracted from the full text article. ACM has opted to expose the complete List rather than only correct and linked references.
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REVIEW
"Panamalai R. Parthasarathy : Reviewer"
Cui et al. propose a novel statistical capacitance-extraction method, StatCap, for three-dimensional (3D) interconnects considering process variations. The new method is based on the spectral stochastic method, where orthogonal polynomials are use
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