ACM Home Page
Please provide us with feedback. Feedback
Variational capacitance modeling using orthogonal polynomial method
Full text PdfPdf (190 KB)
Source
Great Lakes Symposium on VLSI archive
Proceedings of the 18th ACM Great Lakes symposium on VLSI table of contents
Orlando, Florida, USA
SESSION: Session 1A: Modeling and Design under Variations table of contents
Pages 23-28  
Year of Publication: 2008
ISBN:978-1-59593-999-9
Authors
Jian Cui  University of California, Riverside, Riverside, CA, USA
Gengsheng Chen  Fudan University, Shanghai, China
Ruijing Shen  University of California, Riverside, Riverside, CA, USA
Sheldon Tan  University of California, Riverside, Riverside, CA, USA
Wenjian Yu  Tsinghua University, Beijing, China
Jiarong Tong  Fudan University, Shanghai, China
Sponsors
SIGDA: ACM Special Interest Group on Design Automation
ACM: Association for Computing Machinery
Publisher
ACM  New York, NY, USA
Bibliometrics
Downloads (6 Weeks): 8,   Downloads (12 Months): 52,   Citation Count: 0
Additional Information:

abstract   references   index terms   review   collaborative colleagues  

Tools and Actions: Request Permissions Request Permissions    Review this Article  
DOI Bookmark: Use this link to bookmark this Article: http://doi.acm.org/10.1145/1366110.1366119
What is a DOI?

ABSTRACT

In this paper, we propose a novel statistical capacitance extraction method for interconnects considering process variations. The new method, called statCap, is based on the spectral stochastic method where orthogonal polynomials are used to represent the statistical processes in a deterministic way. We first show how the variational potential coefficient matrix is represented in a first-order form using Taylor expansion and orthogonal decomposition. Then an augmented potential coefficient matrix, which consists of the coefficients of the polynomials, is derived. After that, corresponding augmented system is solved to obtain the variational capacitance values in the orthogonal polynomial form. Experimental results show that our method is two orders of magnitude faster than the recently proposed statistical capacitance extraction method based on the spectral stochastic collocation approach and many orders of magnitude faster than the Monte Carlo method for several practical interconnect structures.


REFERENCES

Note: OCR errors may be found in this Reference List extracted from the full text article. ACM has opted to expose the complete List rather than only correct and linked references.

 
1
 
2
R. Ghanem, "The nonlinear Gaussian spectrum of log-normal stochastic processes and variables," Journal of Applied Mechanics, vol. 66, pp. 964--973, December 1999.
 
3
 
4
 
5
A. Klimke, "Sparse Grid Interpolation Toolbox -- user's guide," University of Stuttgart, Tech. Rep. IANS report 2006/001, 2006.
6
 
7
A. Labun, "Rapid method to account for process variation in full-chip capacitance extraction," IEEE Trans. on Computer-Aided Design of Integrated Circuits and Systems, vol. 23, pp. 941--951, June 2004.
 
8
N. Mi, J. Fan, S. X.-D. Tan, Y. Cai, and X. Hong, "Statistical analysis of on-chip power delivery networks considering lognormal leakage current variations with spatial correlations," IEEE Trans. on Circuits and Systems I: Fundamental Theory and Applications, 2008, in press.
 
9
 
10
K. Narbos and J. White, "FastCap: a multipole accelerated 3D capacitance extraction program," IEEE Trans. on Computer-Aided Design of Integrated Circuits and Systems, vol. 10, no. 11, pp. 1447--1459, 1991.
 
11
S. Nassif, "Delay variability: sources, impact and trends," in Proc. IEEE Int. Solid-State Circuits Conf., San Francisco, CA, Feb 2000, pp. 368--369.
 
12
 
13
C. C. Paige and M. A. Saunders, "Solution of sparse indefinite systems of linear equations," SIAM J. on Numerical Analysis, no. 4, pp. 617---629, September 1975.
 
14
S. Vrudhula, J. M. Wang, , and P. Ghanta, "Hermite polynomial based interconnect analysis in the presence of process variations," IEEE Trans. on Computer--Aided Design of Integrated Circuits and Systems, vol. 25, no. 10, 2006.
 
15
D. Wilton, S. Rao, A. Glisson, D. Schaubert, O. Al-Bundak, and C. Butler, "Potential integrals for uniform and linear source distributions on polygonal and polyhedral domains,"IEEE Trans. on Antennas and Propagation, vol. AP-32, no. 3, pp. 276--281, March 1984.
 
16
 
17
 
18
 
19
 
20
 
21
interconnect capacitance," in ICCAD '04: Proceedings of the 2004 IEEE/ACM International conference on Computer-aided design. Washington, DC, USA: IEEE Computer Society, 2004, pp. 887---891.


REVIEW

"Panamalai R. Parthasarathy : Reviewer"

Cui et al. propose a novel statistical capacitance-extraction method, StatCap, for three-dimensional (3D) interconnects considering process variations. The new method is based on the spectral stochastic method, where orthogonal polynomials are use  more...

Collaborative Colleagues:
Jian Cui: colleagues
Gengsheng Chen: colleagues
Ruijing Shen: colleagues
Sheldon Tan: colleagues
Wenjian Yu: colleagues
Jiarong Tong: colleagues