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What causes a system to satisfy a specification?
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ACM Transactions on Computational Logic (TOCL) archive
Volume 9 ,  Issue 3  (June 2008) table of contents
Article No. 20  
Year of Publication: 2008
ISSN:1529-3785
Authors
Hana Chockler  IBM Research, Haifa, Israel
Joseph Y. Halpern  Cornell University, Ithaca, NY
Orna Kupferman  Hebrew University, Jerusalem, Israel
Publisher
ACM  New York, NY, USA
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ABSTRACT

Even when a system is proven to be correct with respect to a specification, there is still a question of how complete the specification is, and whether it really covers all the behaviors of the system. Coverage metrics attempt to check which parts of a system are actually relevant for the verification process to succeed. Recent work on coverage in model checking suggests several coverage metrics and algorithms for finding parts of the system that are not covered by the specification. The work has already proven to be effective in practice, detecting design errors that escape early verification efforts in industrial settings. In this article, we relate a formal definition of causality given by Halpern and Pearl to coverage. We show that it gives significant insight into unresolved issues regarding the definition of coverage and leads to potentially useful extensions of coverage. In particular, we introduce the notion of responsibility, which assigns to components of a system a quantitative measure of their relevance to the satisfaction of the specification.


REFERENCES

Note: OCR errors may be found in this Reference List extracted from the full text article. ACM has opted to expose the complete List rather than only correct and linked references.

 
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REVIEW

"Paparao S Kavalipati : Reviewer"

Properties of finite state systems can be expressed using temporal languages; checking whether a given system satisfies the properties specified is an interesting verification problem. There are tools that provide estimations on how well the testi  more...

Collaborative Colleagues:
Hana Chockler: colleagues
Joseph Y. Halpern: colleagues
Orna Kupferman: colleagues