ACM Home Page
Please provide us with feedback. Feedback
Predicting cluster tool behavior with slow down factors
Full text PdfPdf (152 KB)
Source Winter Simulation Conference archive
Proceedings of the 39th conference on Winter simulation: 40 years! The best is yet to come table of contents
Washington D.C.
SESSION: Semiconductor manufacturing: semiconductor manufacturing equipment modeling table of contents
Pages 1755-1760  
Year of Publication: 2007
ISBN:1-4244-1306-0
Authors
Robert Unbehaun  Dresden University of Technology, Dresden, Germany
Oliver Rose  Dresden University of Technology, Dresden, Germany
Sponsors
INFORMS-SIM : Institute for Operations Research and the Management Sciences: Simulation Society
NIST : National Institute of Standards and Technology
(SCS) : The Society for Modeling and Simulation International
ACM/SIGSIM : Association for Computing Machinery: Special Interest Group on Simulation
IIE : Institute of Industrial Engineers
ASA : American Statistical Association
IEEE/SMC : Institute of Electrical and Electronics Engineers: Systems, Man, and Cybernetics Society
Publisher
IEEE Press  Piscataway, NJ, USA
Bibliometrics
Downloads (6 Weeks): 1,   Downloads (12 Months): 7,   Citation Count: 1
Additional Information:

abstract   references   cited by   collaborative colleagues  

Tools and Actions: Review this Article  

ABSTRACT

Cluster tools are representatives of a special kind of tool where process times of jobs depend on the combination in which they are processed together on the tool and hence, depending on the sequence in which they are processed at a tool. To evaluate schedules of jobs to be processed at such a tool an estimation method is needed since a detailed simulation takes too long. In this paper, we present a method based on slow down factors which produces promising results and gives hints for the development of intelligent scheduling methods for this kind of tools.


REFERENCES

Note: OCR errors may be found in this Reference List extracted from the full text article. ACM has opted to expose the complete List rather than only correct and linked references.

 
1
Atherton, L. F., and R. W. Atherton. 1995. Wafer Fabrication: Factory Performance and Analysis. Kluwer.
 
2
Joo, Y.-J., and T.-E. Lee. 2004. Virtual Control: A Virtual Cluster Tool for Testing and Verifying a Cluster Tool Controller and a Scheduler. IEEE Robotics & Automation Magazine, 11(3), 33--49.
 
3
 
4
Niedermayer, H., and Rose, O. 2003. A Simulation-based Analysis of the Cycle Time of Cluster Tools in Semiconductor Manufacturing. In Proceedings of the 15th European Simulation Symposium.
 
5
Perkinson, T. L., P. K. McLarty, R. S. Gyurcsik, and R. K. Cavin III. 1994. Single-Wafer Cluster Tool Performance: An Analysis of Throughput. IEEE Transactions on Semiconductor Manufacturing, 7 (3), 369--373.
 
6
Perkinson, T. L., P. K. McLarty, R. S. Gyurcsik, and R. K. Cavin III. 1996. Single-Wafer Cluster Tool Performance: An Analysis of the Effects of Redundant Chambers and Revisitation Sequences on Throughput. IEEE Transactions on Semiconductor Manufacturing, 9 (3), 384--400.
 
7

Collaborative Colleagues:
Robert Unbehaun: colleagues
Oliver Rose: colleagues