| Automatic generation of simulation models for semiconductor manufacturing |
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Winter Simulation Conference
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Proceedings of the 39th conference on Winter simulation: 40 years! The best is yet to come
table of contents
Washington D.C.
SESSION: Modeling methodology A: petri nets II - related methods and techniques
table of contents
Pages 648-657
Year of Publication: 2007
ISBN:1-4244-1306-0
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IEEE Press
Piscataway, NJ, USA
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Downloads (6 Weeks): 3, Downloads (12 Months): 32, Citation Count: 0
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ABSTRACT
This article gives an overview of a framework for automatically generating large-scale simulation models from a domain specific problem definition data schema, here semiconductor manufacturing. This simulation model uses an object-oriented Petri net data structure. The Petri net based simulation uses the same enabling rules as classical Petri nets, but has extensions of time and priorities. This approach minimizes the effort of model verification. Each object identified in the problem data specification is mapped to corresponding Petri net fragments. The Petri net simulation model is synthesized from verifiable subnets. This allows ensuring the liveness of the final Petri net simulation model. The applicability of this approach is demonstrated by generating a simulation model based on the Sematech data set.
REFERENCES
Note: OCR errors may be found in this Reference List extracted from the full text article. ACM has opted to expose the complete List rather than only correct and linked references.
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