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Fault-tolerant multi-level logic decoder for nanoscale crossbar memory arrays
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Source International Conference on Computer Aided Design archive
Proceedings of the 2007 IEEE/ACM international conference on Computer-aided design table of contents
San Jose, California
SESSION: Design automation and defect tolerance techniques for emerging technologies table of contents
Pages 765-772  
Year of Publication: 2007
ISBN ~ ISSN:1092-3152 , 1-4244-1382-6
Authors
M. Haykel Ben Jamaa  Integrated Systems Laboratory (LSI), EPFL, Lausanne, Switzerland
Kirsten E. Moselund  Electronics Laboratory (LEG), EPFL, Lausanne, Switzerland
David Atienza  Integrated Systems Laboratory (LSI), EPFL, Lausanne, Switzerland and Complutense University (UCM), Madrid, Spain
Didier Bouvet  Electronics Laboratory (LEG), EPFL, Lausanne, Switzerland
Adrian M. Ionescu  Electronics Laboratory (LEG), EPFL, Lausanne, Switzerland
Yusuf Leblebici  Microelectronic Systems Laboratory (LSM), EPFL, Lausanne, Switzerland
Giovanni De Micheli  Integrated Systems Laboratory (LSI), EPFL, Lausanne, Switzerland
Sponsors
: IEEE CASS/CANDE
SIGDA: ACM Special Interest Group on Design Automation
IEEE-CS\DATC : IEEE Computer Society
CEDA : Council on Electronic Design Automation
Publisher
IEEE Press  Piscataway, NJ, USA
Bibliometrics
Downloads (6 Weeks): 10,   Downloads (12 Months): 51,   Citation Count: 2
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ABSTRACT

Several technologies with sub-lithographic features are targeting the fabrication of crossbar memories in which the nanowire decoder is playing a major role. In this paper, we suggest a way to reduce the decoder size and keep it defect tolerant by using multiple threshold voltages (VT), which is enabled by our underlying technology. We define two types of multi-valued decoders and model the defects they undergo due to the VT variation. Multi-valued hot decoders yield better area saving than n-ary reflexive codes (NRC), and under severe conditions, NRC enables a non-vanishing part of the code space to recover. There are many combinations of decoder type and number of VT's yielding equal effective memory capacities. The optimal choice saves area up to 24%. We also show that the precision of the addressing voltages for decoders with unreliable VT's is a crucial parameter for the decoder design and permits large savings in memory area.


REFERENCES

Note: OCR errors may be found in this Reference List extracted from the full text article. ACM has opted to expose the complete List rather than only correct and linked references.

 
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Collaborative Colleagues:
M. Haykel Ben Jamaa: colleagues
Kirsten E. Moselund: colleagues
David Atienza: colleagues
Didier Bouvet: colleagues
Adrian M. Ionescu: colleagues
Yusuf Leblebici: colleagues
Giovanni De Micheli: colleagues