| A hybrid scheme for compacting test responses with unknown values |
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International Conference on Computer Aided Design
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Proceedings of the 2007 IEEE/ACM international conference on Computer-aided design
table of contents
San Jose, California
SESSION: Test compression and test power
table of contents
Pages 513-519
Year of Publication: 2007
ISBN ~ ISSN:1092-3152 , 1-4244-1382-6
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Authors
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Mango C.-T. Chao
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National Chiao Tung Univ., Hsinchu, Taiwan
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Kwang-Ting Cheng
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UC Santa Barbara, Santa Barbara, CA
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Seongmoon Wang
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NEC Labs. America, Princeton, NJ
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Srimat T. Chakradhar
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NEC Labs. America, Princeton, NJ
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Wen-Long Wei
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NEC Labs. America, Princeton, NJ
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IEEE Press
Piscataway, NJ, USA
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Downloads (6 Weeks): 1, Downloads (12 Months): 13, Citation Count: 0
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ABSTRACT
This paper presents a hybrid compaction scheme for test responses containing unknown values, which consists of a space compactor and an unknown-blocking Multiple Input Signature Registers (MISR). The proposed scheme guarantees no coverage loss for the modeled faults. The proposed hybrid scheme can also be tuned to observe any user-specified percentage of responses for controlling the coverage loss for un-modeled faults. The experimental results demonstrate that, in comparison with a space compactor or an unknown-blocking MISR alone, the hybrid compaction scheme achieves a lower coverage loss without demanding more test-data volume. In addition, we propose a quantitative approach to estimate the required percentage of observable responses for the proposed scheme, directly based on a test-quality metric of un-modeled faults.
REFERENCES
Note: OCR errors may be found in this Reference List extracted from the full text article. ACM has opted to expose the complete List rather than only correct and linked references.
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