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An incremental learning framework for estimating signal controllability in unit-level verification
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Source International Conference on Computer Aided Design archive
Proceedings of the 2007 IEEE/ACM international conference on Computer-aided design table of contents
San Jose, California
SESSION: High quality test cases for verification table of contents
Pages 250-257  
Year of Publication: 2007
ISBN ~ ISSN:1092-3152 , 1-4244-1382-6
Authors
Charles H.-P. Wen  National Chiao-Tung University, Hsinchu, Taiwan
Li-C. Wang  Univ. of California, Santa Barbara, CA
Jayanta Bhadra  Freescale Semiconductor Inc., Austin, TX
Sponsors
: IEEE CASS/CANDE
SIGDA: ACM Special Interest Group on Design Automation
IEEE-CS\DATC : IEEE Computer Society
CEDA : Council on Electronic Design Automation
Publisher
IEEE Press  Piscataway, NJ, USA
Bibliometrics
Downloads (6 Weeks): 5,   Downloads (12 Months): 23,   Citation Count: 0
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ABSTRACT

Unit-level verification is a critical step to the success of full-chip functional verification for microprocessor designs. In the unit-level verification, a unit is first embedded in a complex software that emulates the behavior of surrounding units, and then a sequence of stimuli is applied to measure the functional coverage. In order to generate such a sequence, designers need to comprehend the relationship between boundaries at the unit under verification and at the inputs to the emulation software. However, figuring out this relationship can be very difficult. Therefore, this paper proposes an incremental learning framework that incorporates an ordered-binary-decision-forest(OBDF) algorithm, to automate estimating the controllability of unit-level signals and to provide full-chip level information for designers to govern these signals. Mathematical analysis shows that the proposed OBDF algorithm has lower model complexity and lower error variance than the previous algorithms. Meanwhile, a commercial microprocessor core is also applied to demonstrate that controllability of input signals on the load/store unit in the microprocessor core can be estimated automatically and information about how to govern these signals can also be extracted successfully.


REFERENCES

Note: OCR errors may be found in this Reference List extracted from the full text article. ACM has opted to expose the complete List rather than only correct and linked references.

 
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Collaborative Colleagues:
Charles H.-P. Wen: colleagues
Li-C. Wang: colleagues
Jayanta Bhadra: colleagues