| An incremental learning framework for estimating signal controllability in unit-level verification |
| Full text |
Pdf
(273 KB)
|
| Source
|
International Conference on Computer Aided Design
archive
Proceedings of the 2007 IEEE/ACM international conference on Computer-aided design
table of contents
San Jose, California
SESSION: High quality test cases for verification
table of contents
Pages 250-257
Year of Publication: 2007
ISBN ~ ISSN:1092-3152 , 1-4244-1382-6
|
|
Authors
|
|
| Sponsors |
|
| Publisher |
IEEE Press
Piscataway, NJ, USA
|
| Bibliometrics |
Downloads (6 Weeks): 5, Downloads (12 Months): 23, Citation Count: 0
|
|
|
ABSTRACT
Unit-level verification is a critical step to the success of full-chip functional verification for microprocessor designs. In the unit-level verification, a unit is first embedded in a complex software that emulates the behavior of surrounding units, and then a sequence of stimuli is applied to measure the functional coverage. In order to generate such a sequence, designers need to comprehend the relationship between boundaries at the unit under verification and at the inputs to the emulation software. However, figuring out this relationship can be very difficult. Therefore, this paper proposes an incremental learning framework that incorporates an ordered-binary-decision-forest(OBDF) algorithm, to automate estimating the controllability of unit-level signals and to provide full-chip level information for designers to govern these signals. Mathematical analysis shows that the proposed OBDF algorithm has lower model complexity and lower error variance than the previous algorithms. Meanwhile, a commercial microprocessor core is also applied to demonstrate that controllability of input signals on the load/store unit in the microprocessor core can be estimated automatically and information about how to govern these signals can also be extracted successfully.
REFERENCES
Note: OCR errors may be found in this Reference List extracted from the full text article. ACM has opted to expose the complete List rather than only correct and linked references.
| |
1
|
|
 |
2
|
James Monaco , David Holloway , Rajesh Raina, Functional verification methodology for the PowerPC 604 microprocessor, Proceedings of the 33rd annual conference on Design automation, p.319-324, June 03-07, 1996, Las Vegas, Nevada, United States
[doi> 10.1145/240518.240579]
|
 |
3
|
|
| |
4
|
|
| |
5
|
|
| |
6
|
C. Wen, O. Guzey, L.-C. Wang and J. Yang, "Simulation-based Functional Test Justification Using a Boolean Data Miner," to appear in IEEE Int'l Conf. on Computer Design, 2006.
|
 |
7
|
|
 |
8
|
M. Kearns , M. Li , L. Pitt , L. Valiant, On the learnability of Boolean formulae, Proceedings of the nineteenth annual ACM symposium on Theory of computing, p.285-295, January 1987, New York, New York, United States
[doi> 10.1145/28395.28426]
|
| |
9
|
|
| |
10
|
T. Hastie, R. Tibshirani, and J. Friedman, The Elements of Statistical Learning - Date Mining, Inference, and Prediction, Springer, 2001.
|
| |
11
|
|
| |
12
|
A. Krogh, and P. Sollich "Statistical mechanics of ensemble learning," Physical Review, vol. 55, no. 1, pp. 811--816, 1997.
|
| |
13
|
K. Tumer, and J. Ghosh "Error Correlation and Error Reduction in Ensemble Classifiers," Connection Science, vol. 8, no. 3--4, pp. 385--403, 1996.
|
| |
14
|
|
| |
15
|
Leo Breiman, Jerome H. Friedman, Richard A. Olshen, and Charles J. Stone. Classification and regression trees. Wadsworth Inc., Belmont, California, 1984.
|
| |
16
|
|
| |
17
|
B. Efron, and R. Tibshirani, "The bootstrap method for standard errors and confidence intervals of the adjusted attributable risk," Statistical Science, vol. 1, no. 1, pp. 54--77, 1986.
|
| |
18
|
I. Kononenko, "On biases in estimating multi-valued attributes," Int'l Joint Conf. on Artificial Intelligence, pp. 1034--1040, 1995.
|
| |
19
|
|
|