| Extraction of bug localization benchmarks from history |
| Full text |
Pdf
(183 KB)
|
Source
|
Automated Software Engineering
archive
Proceedings of the twenty-second IEEE/ACM international conference on Automated software engineering
table of contents
Atlanta, Georgia, USA
POSTER SESSION: Posters
table of contents
Pages 433-436
Year of Publication: 2007
ISBN:978-1-59593-882-4
|
|
Authors
|
|
| Sponsors |
|
| Publisher |
|
| Bibliometrics |
Downloads (6 Weeks): 18, Downloads (12 Months): 72, Citation Count: 5
|
|
|
ABSTRACT
Researchers have proposed a number of tools for automatic bug localization. Given a program and a description of the failure, such tools pinpoint a set of statements that are most likely to contain the bug. Evaluating bug localization tools is a difficult task because existing benchmarks are limited in size of subjects and number of bugs. In this paper we present iBUGS, an approach that semiautomatically extracts benchmarks for bug localization from the history of a project. For ASPECTJ, we extracted 369 bugs, 223 out of these had associated test cases. We demonstrate the relevance of our dataset with a case study on the bug localization tool AMPLE
REFERENCES
Note: OCR errors may be found in this Reference List extracted from the full text article. ACM has opted to expose the complete List rather than only correct and linked references.
 |
1
|
|
| |
2
|
V. Dallmeier, C. Lindig, and A. Zeller. Lightweight defect localization for java. In Proceedings of 19th European Conference on Object-Oriented Programming (ECOOP), pages 528--550, 2005.
|
| |
3
|
V. Dallmeier and T. Zimmermann. Automatic extraction of bug localization benchmarks from history. Technical report, Saarland University, Saarbrücken, Germany, June 2007.
|
| |
4
|
|
 |
5
|
|
 |
6
|
Ben Liblit , Mayur Naik , Alice X. Zheng , Alex Aiken , Michael I. Jordan, Scalable statistical bug isolation, Proceedings of the 2005 ACM SIGPLAN conference on Programming language design and implementation, June 12-15, 2005, Chicago, IL, USA
|
 |
7
|
Chao Liu , Xifeng Yan , Long Fei , Jiawei Han , Samuel P. Midkiff, SOBER: statistical model-based bug localization, Proceedings of the 10th European software engineering conference held jointly with 13th ACM SIGSOFT international symposium on Foundations of software engineering, September 05-09, 2005, Lisbon, Portugal
|
| |
8
|
S. Lu, Z. Li, F. Qin, L. Tan, P. Zhou, and Y. Zhou. Bugbench: Benchmarks for evaluating bug detection tools. In PLDI Workshop on the Evaluation of Software Defect Detection Tools, June 2005.
|
| |
9
|
|
 |
10
|
Thomas Reps , Thomas Ball , Manuvir Das , James Larus, The use of program profiling for software maintenance with applications to the year 2000 problem, Proceedings of the 6th European conference held jointly with the 5th ACM SIGSOFT international symposium on Foundations of software engineering, p.432-449, September 22-25, 1997, Zurich, Switzerland
|
 |
11
|
|
| |
12
|
J. Spacco, D. Hovemeyer, and W. Pugh. Bugbench: Benchmarks for evaluating bug detection tools. In PLDI Workshop on the Evaluation of Software Defect Detection Tools, June 2005.
|
 |
13
|
Jaime Spacco , Jaymie Strecker , David Hovemeyer , William Pugh, Software repository mining with Marmoset: an automated programming project snapshot and testing system, Proceedings of the 2005 international workshop on Mining software repositories, p.1-5, May 17-17, 2005, St. Louis, Missouri
|
 |
14
|
Jinlin Yang , David Evans , Deepali Bhardwaj , Thirumalesh Bhat , Manuvir Das, Perracotta: mining temporal API rules from imperfect traces, Proceedings of the 28th international conference on Software engineering, May 20-28, 2006, Shanghai, China
[doi> 10.1145/1134285.1134325]
|
 |
15
|
|
 |
16
|
|
CITED BY 5
|
|
|
|
|
|
|
|
Alex Edwards , Sean Tucker , Sébastien Worms , Rahul Vaidya , Brian Demsky, AFID: an automated fault identification tool, Proceedings of the 2008 international symposium on Software testing and analysis, July 20-24, 2008, Seattle, WA, USA
|
|
|
Premkumar Devanbu , Brendan Murphy , Nachiappan Nagappan , Thomas Zimmermann , Valentin Dallmeier, DEFECTS 2008: international workshop on defects in large software systems, Proceedings of the 2008 international symposium on Software testing and analysis, July 20-24, 2008, Seattle, WA, USA
|
|
|
|
|