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A methodology for analysis and verification of power gated circuits with correlated results
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International Symposium on Low Power Electronics and Design archive
Proceedings of the 2007 international symposium on Low power electronics and design table of contents
Portland, OR, USA
POSTER SESSION: Posters table of contents
Pages: 351 - 354  
Year of Publication: 2007
ISBN:978-1-59593-709-4
Authors
Aveek Sarkar  Apache Design Solutions
Shen Lin  Apache Design Solutions
Kai Wang  Apache Design Solutions
Sponsors
ACM: Association for Computing Machinery
SIGDA: ACM Special Interest Group on Design Automation
Publisher
ACM  New York, NY, USA
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ABSTRACT

With the rapid proliferation of handheld and other mobile devices, electronic circuits need to reduce both operational and off-state power consumption. This is necessary for both the chips and the end products to be competitive in their respective markets. In this paper, details of an innovative solution that combines full-chip level capacity with transistor level accuracy is presented which integrated circuit designers can use to analyze and optimize circuits that employ a commonly used standby leakage current reduction technique. An advanced capability of this tool like its ability to simulate multiple operating modes of such circuits is discussed. This analysis approach was demonstrated to have very good correlation to both silicon and spice based measurements..


REFERENCES

Note: OCR errors may be found in this Reference List extracted from the full text article. ACM has opted to expose the complete List rather than only correct and linked references.

 
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Hensen, et al, "Analysis of leakage currents and impact on off-state power consumption for CMOS technology in the 100-nm regime", IEEE Transactions on Electron Devices, Vol. 47, No. 7, July 2000 pp. 1393--1400.
 
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Semiconductor Industry Association, "The International Technology Roadmap for Semiconductors", 2001.
 
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Shen, et al, "Full-chip Vectorless Dynamic Power Integrity Analysis and Verification Against 100uV/100ps-Resolution Measurement", Custom Integrated Circuits Conference, 24-8, Oct 2004.
 
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Shen, et al, "Reshaping Nanometer Flows with Physical Power Integrity", White Paper, Apache Design Solutions.

Collaborative Colleagues:
Aveek Sarkar: colleagues
Shen Lin: colleagues
Kai Wang: colleagues